This paper presents results of a successful four year effort funded by the Air Force to develop a measurement system for the study of optical-thin-film thermal transport properties. Data are presented on several coated samples. Characteristic features of the data are interpreted in terms of behavior expected on the basis of solutions of the heat diffusion equation. Comparisons are made between observed coating data and model predictions based on handbook data on coating materials in bulk format. These comparisons show close agreement for measurable properties in the special cases studied. The data are found to be free of unexpected structure.

We report the present status of a project to measure the thermal transport properties of optical coating materials in thin-film format. The measurement technique employs a noncontact nondestructive method based on thermal diffusion-wave interferometry. Initial results confirm the feasibility of the method. Data on nickel coatings show thin film transport parameters slightly smaller than corresponding bulk values, and in addition clearly display the effects of a nonideal thermal bond between the coating and the substrate.

The objectives of our research program have been to carry out a systematic experimental and theoretical study of the thermal and transport properties of granular metal films. This work has involved the preparation of a number of different granular metal systems by RF sputter deposition, characterization of these materials by x-ray diffraction (XRD), transmission electron microscopy (TEM), and x-ray photoelectron spectroscopy (XPS), the study of thermal properties by differential scanning calorimetry (DSC) measurements, and the study of the electrical transport behavior from room temperature to below 100 mK and, at low temperatures, in applied magnetic fields up to about 6 T. Using a variety of complementary analytical and numerical techniques, detailed theoretical studies have also been carried out on the structure, melting, transport, and optical properties of small granular particles.

Thin Films for Optical Coating emphasizes the applications of thin films, deposition of thin films, and thin film characterization. Unlike monographs on this subject, this book presents the views of many expert authors. Individual chapters span a wide arc of topics within this field of study. The book offers an introduction to usual and unusual applications of optical thin films, treating in a more qualitative way general topics such as anticounterfeiting coatings, decorative coatings, light switches, contrast enhancement coatings, multiplexers, optical memories, and more. Contributors review thin film media for optical data storage, UV broadband and narrow-band filters, and optically active thin film coatings. Ion beam sputtering and magnetron sputtering deposition methods are described in detail. Characterization techniques are provided, including Raman spectroscopy and absorption measurements. The book also offers theories on light scattering of thin dielectric films and the electromagnetic properties of nanocermet thin films. This reference incorporates recent research by the individual authors with their views of current developments in their respective fields. Of particular interest to the reader will be an assessment of the historical developments of thin film physics written by one of the fathers of thin film technology, Professor M. Auwärter.

Of meeting -- Materials and measurements -- Surfaces and mirrors -- Thin films -- Fundamental mechanisms -- Presented by title only (papers not presented at conference).