Reflectance and emittance spectroscopy are increasingly important tools in remote sensing and have been employed in most recent planetary spacecraft missions. They are primarily used to measure properties of disordered materials, especially in the interpretation of remote observations of the surfaces of the Earth and other terrestrial planets. This book gives a quantitative treatment of the physics of the interaction of electromagnetic radiation with particulate media, such as powders and soils. Subjects covered include electromagnetic wave propagation, single particle scattering, diffuse reflectance, thermal emittance and polarisation. This new edition has been updated to include a quantitative treatment of the effects of porosity, a detailed discussion of the coherent backscatter opposition effect, a quantitative treatment of simultaneous transport of energy within the medium by conduction and radiation, and lists of relevant databases and software. This is an essential reference for research scientists, engineers and advanced students of planetary remote sensing.

Reflectance spectroscopy is the investigation of the spectral composi tion of surface-reflected radiation with respect to its angularly dependent intensity and the composition of the incident primary radiation. Two limiting cases are important: The first concerns regular (specular) reflection from a smooth surface, and the second diffuse reflection from an ideal matte surface. All possible variations are found in practice between these two extremes. For the two extreme cases, two fundamentally different methods of reflectance spectroscopy are employed: The first of these consists in evaluating the optical constants n (refractive index) and x (absorption index) from the measured regular reflection by means of the Fresnel equations as a function of the wave A. This rather old and very troublesome procedure, which is length incapable of very accurate results, has recently been modified by Fahren fort by replacing the air-sample phase boundary by the phase boundary between a dielectric of higher refractive index (n ) and the sample (n ). 1 2 If the sample absorbs no radiation and the angle of incidence exceeds a certain definite value, total reflection occurs. On close optical contact between the two phases, a small amount of energy is transferred into the less dense phase because of diffraction phenomena at the edges of the incident beam. The energy flux in the two directions through the phase boundary caused by this is equal, however, so that 'total reflection takes place.

Comprehensive overview of the spectroscopic, mineralogical, and geochemical techniques used in planetary remote sensing.

The main subject division of this book include the theory of Diffuse reflectance spectroscopy; measurement and standardization of diffuse reflectance; instrumentation; application to color measurement and physical, inorganic, and organic chemistry; and applications in chromatographic analysis.While the use of reflectance spectroscopy dates from the 1920s, it has only been in the last decade that its analytical potential has been developed. Interestingly, much of the early research involved industrial uses where measurement of color was required. The development and acceptance of thin-layer chromatography has opened up new areas of analysis for the application of this technique.It is not the purpose of this book to delve deeply into the theoretical aspects of reflectance spectroscopy, as this book has already been done in several previous books. Insofar as it is possible, this book is an up-to-date guide to instruments and techniques intended primarily for the chemical analyst, though it is hoped that it may contain information of interest to other scientists. The potential for the application of this technique is great and the authors feel confident that the coming decade will see many interesting developments in this type of spectroscopy study, particularly in the field of analysis.

Presents coverage of internal reflection spectroscopy (IRS) and its applications to polymer, semiconductor, biological, electrochemical and membrane research. It describes the theory and procedures and identifies the spectral regions, from materials characterization to process monitoring.

Diffuse reflection is widely used, especially in near infrared spectroscopy. However, its theoretical basis has not been fully explained. The father and son team of Don and Kevin Dahm have been developing a new theory of diffuse reflectance for some years.