En bok for alle som er betatt av TV-serien "X-Files". Dette er en guide tilde mystiske og uforklarlige sannhetene bak de forskjellige episodene. Det viser seg at selv de mest bisarre sakene som blir etterforsket av Mulder og Scully har noe basis i virkeligheten. Denne boken forteller om vitenskap- elige mysterier og merkelige hendelser som ligger bak kulissene. Boken inneholder også 49 korte spørrekonkurranser for de som tror de vet alt om TV-serien. Heftet, 19 x 23 cm., 227 s.

A fan's guide to the television show provides detailed background information on the program's third season, uncovering the real-life paranormal encounters and events that inspired each case.

"In Trust No One, this all new and completely authorized guide, the fans of The X-Files can go behind the cameras and get a firsthand look at what makes this show unique."--Cover.

The truth is, the nits are out there.... What's weird about Samantha T. Mulder's birthday? (She has two of them: January 22 and November 21.) What's amazing about Mulder's cell phone? (It operates inside a metal boxcar, buried in a canyon, out in the deserts of New Mexico: anywhere!) Scully and Mulder, you have reason to be paranoid. Armed with keen detective sense, attention to detail, and a VCR, author Phil Farrand has done some forensic work of his own and dissected every technical foul-up, plot oversight, and alien intrusion on the X-Files(r). Paranormal he's not, but he'd like to know why T.A. Berube has a six-digit zip code or how the VCRs at the 2400 Court motel in Braddock Heights, Maryland, can play a tape after it's been ejected. Nitpicking? You bet. So join his conspiracy to have hours of mental stimulation and fun with: Equipment flubs Changed premises Plot oversights Fun facts Trivia questions Reviews of every show for all four seasons And more

A Signal Integrity Engineer’s Companion Real-Time Test and Measurement and Design Simulation Geoff Lawday David Ireland Greg Edlund Foreword by Chris Edwards, Editor, IET Electronics Systems and Software magazine Prentice Hall Modern Semiconductor Design Series Prentice Hall Signal Integrity Library Use Real-World Test and Measurement Techniques to Systematically Eliminate Signal Integrity Problems This is the industry’s most comprehensive, authoritative, and practical guide to modern Signal Integrity (SI) test and measurement for high-speed digital designs. Three of the field’s leading experts guide you through systematically detecting, observing, analyzing, and rectifying both modern logic signal defects and embedded system malfunctions. The authors cover the entire life cycle of embedded system design from specification and simulation onward, illuminating key techniques and concepts with easy-to-understand illustrations. Writing for all electrical engineers, signal integrity engineers, and chip designers, the authors show how to use real-time test and measurement to address today’s increasingly difficult interoperability and compliance requirements. They also present detailed, start-to-finish case studies that walk you through commonly encountered design challenges, including ensuring that interfaces consistently operate with positive timing margins without incurring excessive cost; calculating total jitter budgets; and managing complex tradeoffs in high-speed serial interface design. Coverage includes Understanding the complex signal integrity issues that arise in today’s high-speed designs Learning how eye diagrams, automated compliance tests, and signal analysis measurements can help you identify and solve SI problems Reviewing the electrical characteristics of today’s most widely used CMOS IO circuits Performing signal path analyses based on intuitive Time-Domain Reflectometry (TDR) techniques Achieving more accurate real-time signal measurements and avoiding probe problems and artifacts Utilizing digital oscilloscopes and logic analyzers to make accurate measurements in high-frequency environments Simulating real-world signals that stress digital circuits and expose SI faults Accurately measuring jitter and other RF parameters in wireless applications About the Authors: Dr. Geoff Lawday is Tektronix Professor in Measurement at Buckinghamshire New University, England. He delivers courses in signal integrity engineering and high performance bus systems at the University Tektronix laboratory, and presents signal integrity seminars throughout Europe on behalf of Tektronix. David Ireland, European and Asian design and manufacturing marketing manager for Tektronix, has more than 30 years of experience in test and measurement. He writes regularly on signal integrity for leading technical journals. Greg Edlund, Senior Engineer, IBM Global Engineering Solutions division, has participated in development and testing for ten high-performance computing platforms. He authored Timing Analysis and Simulation for Signal Integrity Engineers (Prentice Hall).