Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.

Some of the problems arising from maximum likelihood decision systems in time varying channels are solved by first introducing simple statistics which are functions of the outputs of the correlators of an n-ary detection system. Then methods are developed to use the statistics to a) attach a confidence level to each decision in a maximum likelihood decision system, b) control the error rate at the expense of data rejection, and c) define the critical region for an optimum generalized decision system. These improvements and optimizations are accomplished by taking advantage of the information already available in the sample representing the outputs of n-ary detection systems. The six statistics that are investigated are simple functions of the largest correlator output, the mean, the standard deviation, the sample mean, the sample variance, the next to the largest correlator output, and the smallest correlator output.

This book collects selected papers from the 7th Conference on Signal and Information Processing, Networking and Computers held in Rizhao, China, on September 21-23, 2020. The 7th International Conference on Signal and Information Processing, Networking and Computers (ICSINC) was held in Rizhao, China, on September 21-23, 2020.

This book brings together papers presented at the 2020 International Conference on Communications, Signal Processing, and Systems, which provides a venue to disseminate the latest developments and to discuss the interactions and links between these multidisciplinary fields. Spanning topics ranging from communications, signal processing and systems, this book is aimed at undergraduate and graduate students in Electrical Engineering, Computer Science and Mathematics, researchers and engineers from academia and industry as well as government employees (such as NSF, DOD and DOE).

This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.