Thin films can be used to fabricate optoelectronic devices. Technology is currently focusing on ternary thin film composition because of their structure, inter-band transitions and other optical properties that can be maximized. This book discusses in detail the optical characteristics of ternary thin films and further investigates the behavior of Iron Zinc Sulphide, Lead Silver Sulphide, Copper Silver Sulphide, Copper Zinc Sulphide and Cadmium Zinc Sulphide. Thin films are of fundamental importance in modern technology.

Organic semiconductors are a central topic of advanced materials research. The book is aiming at bridging the gap between the development and production of devices and basic research on thin film characterisation using cutting-edge techniques in surface and interface science. Topics involve organic molecular-based sensors; interfaces in organic diodes and transistors; mobility in organic field effect transistors and space charge problems; integration of optoelectronic nanostructures; nonlinear optical properties of organic nanostructures; the wetting layer problem; how to get from functionalized molecules to nanoaggregates; optical, electrical and mechanical properties of organic nanofibers as well; as near field investigations of organic thin films.

The book is devoted to the design, application and characterization of thin films and structures, with special emphasis on optical applications. It comprises ten papers—five featured and five regular—authored by scientists all over the world. Diverse materials are studied and their possible applications are demonstrated and discussed—transparent conductive coatings and structures from ZnO doped with Al and Ga and Ti-doped SnO2, polymers and nanosized zeolite thin films for optical sensing, TiO2 with linear and nonlinear optical properties, organic diamagnetic materials, broadband optical coatings, CrWN glass molding coatings, and silicon on insulator waveguides.

This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time and insitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development.