Meeting the long-felt need for in-depth information on one of the most advanced material characterization methods, a top team of editors and authors from highly prestigious facilities and institutions covers a range of synchrotron techniques that have proven useful for materials research. Following an introduction to synchrotron radiation and its sources, the second part goes on to describe the various techniques that benefit from this especially bright light, including X-ray absorption, diffraction, scattering, imaging, and lithography. The thrid and final part provides an overview of the applications of synchrotron radiation in materials science. bridging the gap between specialists in synchrotron research and material scientists, this is a unique and indispensable resource for academic and industrial researchers alike.

This conference brings together leading edge researchers from around the world and is a celebration of the increasingly important relationship between materials science and synchrotron radiation research. Special attention was given to the contribution that Synchrotron Radiation techniques have given to unsolved problems in Materials Science. The main organizer of SRMS-6 was the Brazilian Synchrotron Laboratory, with support from several Brazilian and Latin-American Agencies and Universities. The main topical areas of this conference series are, Archaeological Materials, Catalysts and clusters, Complex oxides, Data-storage and Engineering materials, Films, Surfaces and Interfaces, Geo-physical and Electronic materials, Glasses and Ceramics, Liquids, Magnetism, Materials under Extreme conditions (high pressure, etc.), Metals and Alloys, Metamaterials, Molecular electronics, Multiferroics, Nanostructured materials and Self-assembly, Polymers and Biomaterials, Photo materials, Nanofocus techniques, Strongly correlated materials, Superconducting materials, Industrial use of SR, Instrumentation/Recent Developments.

Synchroton radiation (SR) is utilized in most scientific fields. This book will therefore be useful not only for researchers engaged in analytical chemistry, and those studying the basic fields such as physics, chemistry, biology, as well as earth science, medicine, and life science but also for those engaged in research for elucidating structure of material and its function in the application fields including applied physics, semiconductor engineering, and metal engineering. The book has a highly interdisciplinary character. The outstanding characteristics of SR have also contributed to the rapid development of new fields and applications in analytical chemistry. Features of this book: • Explains the basics of SR • Facilities and instrumentation are covered to facilitate the planning of experiments using SR. • Aspects for the future development of SR are included together with an introduction to the latest techniques which are expected to find increasing use in the coming years. This book should stimulate students specializing in analytical chemistry and materials science to have an interest in SR. In addition, it will provide scientists who are beginning analytical chemistry research using SR with instructive and illustrative descriptions. The book can also be used as an explanatory text for advanced research on the application of SR.

Retaining its proven concept, the second edition of this ready reference specifically addresses the need of materials engineers for reliable, detailed information on modern material characterization methods. As such, it provides a systematic overview of the increasingly important field of characterization of engineering materials with the help of neutrons and synchrotron radiation. The first part introduces readers to the fundamentals of structure-property relationships in materials and the radiation sources suitable for materials characterization. The second part then focuses on such characterization techniques as diffraction and scattering methods, as well as direct imaging and tomography. The third part presents new and emerging methods of materials characterization in the field of 3D characterization techniques like three-dimensional X-ray diffraction microscopy. The fourth and final part is a collection of examples that demonstrate the application of the methods introduced in the first parts to problems in materials science. With thoroughly revised and updated chapters and now containing about 20% new material, this is the must-have, in-depth resource on this highly relevant topic.

Structural analysis is becoming increasingly important for the design of novel, advanced engineering materials, components and assemblies. By using the neutrons and synchrotron radiation, information about the micro- and nanostructure of materials can be obtained non-destructively and with high spatial reolution, both in the near-surface region an also in the bulk of samples and components. Besides its coverage of synchrotron and neutron sources, materials and material processes, measuring techniques, and applications, this ready reference both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods an industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.

Besides its coverage of the four important aspects of synchrotron sources, materials and material processes, measuring techniques, and applications, this ready reference presents both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods and industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.