Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays
Title | Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays PDF eBook |
Author | John C. Stover |
Publisher | |
Pages | 152 |
Release | 1999 |
Genre | Science |
ISBN |
Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays
Title | Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays PDF eBook |
Author | |
Publisher | |
Pages | 206 |
Release | 1998 |
Genre | Flatness measurement |
ISBN |
National Semiconductor Metrology Program
Title | National Semiconductor Metrology Program PDF eBook |
Author | National Institute of Standards and Technology (U.S.) |
Publisher | |
Pages | 160 |
Release | 2000 |
Genre | Semiconductors |
ISBN |
National Semiconductor Metrology Program
Title | National Semiconductor Metrology Program PDF eBook |
Author | National Semiconductor Metrology Program (U.S.) |
Publisher | |
Pages | 160 |
Release | 2000 |
Genre | Semiconductors |
ISBN |
Light Scattering and Nanoscale Surface Roughness
Title | Light Scattering and Nanoscale Surface Roughness PDF eBook |
Author | Alexei A. Maradudin |
Publisher | Springer Science & Business Media |
Pages | 513 |
Release | 2010-05-10 |
Genre | Science |
ISBN | 0387356592 |
This book covers both experimental and theoretical aspects of nanoscale light scattering and surface roughness. Topics include: spherical particles located on a substrate; surface and buried interface roughness; surface roughness of polymer thin films; magnetic and thermal fluctuations at planar surfaces; speckle patterns; scattering of electromagnetic waves from a metal; multiple wavelength light scattering; nanoroughness standards.
Surfactants in Precision Cleaning
Title | Surfactants in Precision Cleaning PDF eBook |
Author | Rajiv Kohli |
Publisher | Elsevier |
Pages | 336 |
Release | 2021-10-21 |
Genre | Technology & Engineering |
ISBN | 0128222174 |
Surfactants in Precision Cleaning: Removal of Contaminants at the Micro and Nanoscale is a single source of information on surfactants, emulsions, microemulsions and detergents for removal of surface contaminants at the micro and nanoscale. The topics covered include cleaning mechanisms, effect of surfactants, types of stable dispersions (emulsions, microemulsions, surfactants, detergents, etc.), cleaning technology, and cleaning applications. Users will find this volume an excellent resource on the use of stable dispersions in precision cleaning. - Single source of current information on surfactants, emulsions, microemulsions and detergents for precision cleaning applications - Includes a list of extensive reference sources - Discusses specific selection and properties of surfactants and their use in cleaning - Provides a guide for cleaning applications in different industry sectors
Light Scattering from Microstructures
Title | Light Scattering from Microstructures PDF eBook |
Author | Fernando Moreno |
Publisher | Springer |
Pages | 293 |
Release | 2008-01-11 |
Genre | Technology & Engineering |
ISBN | 3540466142 |
The classical phenomenon of light scattering is one of the most studied t- ics in light-matter interaction and, even today, involves some controversial issues. A present focus of interest for many researchers is the possibility of obtaining information about microstructures, for example surface roughness, and the size, shape and optical properties of particles by means of a n- invasive technique such as the illumination of these objects with light. One of their main tasks is to extract the relevant information from a detailed study of the scattered radiation. This includes: measurement of the light intensity in di erent directions, analysis of its polarization, determination of its stat- tics,etc. Contributionstoresolvingthisproblemareimportantnotonlyfrom the point of view of increasing basic knowledge but also in their applications to several elds of industry and technology. Consider, for example, the pos- bility of distinguishing between di erent types of atmospheric contaminants, biological contaminants in our blood, the detection of microdefects in the manufacturing of semiconductors, magnetic discs and optical components, or the development of biological sensors. During the period September 11-13, 1998, we brought together a group of international experts on light scattering at the Summer School of Laredo at the University of Cantabria. In a series of one-hour lectures, they discussed currentaspectsoflightscatteringfrommicrostructureswithspecialemphasis on recent applications. The present book condenses those lectures into ve parts.