Reliability, Testing, and Characterization of MEMS/MOEMS
Title | Reliability, Testing, and Characterization of MEMS/MOEMS PDF eBook |
Author | |
Publisher | |
Pages | 0 |
Release | 2004 |
Genre | Microelectromechanical systems |
ISBN |
Reliability, Testing, and Characterization of MEMS/MOEMS
Title | Reliability, Testing, and Characterization of MEMS/MOEMS PDF eBook |
Author | Rajeshuni Ramesham |
Publisher | Society of Photo Optical |
Pages | 296 |
Release | 2001 |
Genre | Technology & Engineering |
ISBN | 9780819442864 |
Reliability, Testing, and Characterization of MEMS/MOEMS II
Title | Reliability, Testing, and Characterization of MEMS/MOEMS II PDF eBook |
Author | Rajeshuni Ramesham |
Publisher | Society of Photo Optical |
Pages | 334 |
Release | 2003 |
Genre | Technology & Engineering |
ISBN | 9780819447807 |
Reliability, Testing, and Characterization of MEMS/MOEMS III
Title | Reliability, Testing, and Characterization of MEMS/MOEMS III PDF eBook |
Author | Danelle Mary Tanner |
Publisher | SPIE-International Society for Optical Engineering |
Pages | 0 |
Release | 2004 |
Genre | Technology & Engineering |
ISBN | 9780819452511 |
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Reliability, Testing, and Characterization of MEMS/MOEMS.
Title | Reliability, Testing, and Characterization of MEMS/MOEMS. PDF eBook |
Author | |
Publisher | |
Pages | 332 |
Release | 2001 |
Genre | Microelectromechanical systems |
ISBN |
MEMS Reliability
Title | MEMS Reliability PDF eBook |
Author | Allyson L. Hartzell |
Publisher | Springer Science & Business Media |
Pages | 300 |
Release | 2010-11-02 |
Genre | Technology & Engineering |
ISBN | 144196018X |
The successful launch of viable MEMs product hinges on MEMS reliability, the reliability and qualification for MEMs based products is not widely understood. Companies that have a deep understanding of MEMs reliability view the information as a competitive advantage and are reluctant to share it. MEMs Reliability, focuses on the reliability and manufacturability of MEMS at a fundamental level by addressing process development and characterization, material property characterization, failure mechanisms and physics of failure (POF), design strategies for improving yield, design for reliability (DFR), packaging and testing.
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV
Title | Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV PDF eBook |
Author | Danelle Mary Tanner |
Publisher | SPIE-International Society for Optical Engineering |
Pages | 272 |
Release | 2005 |
Genre | Technology & Engineering |
ISBN | 9780819456908 |
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.