Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV
Title | Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV PDF eBook |
Author | Danelle Mary Tanner |
Publisher | Society of Photo Optical |
Pages | 220 |
Release | 2005 |
Genre | Computers |
ISBN | 9780819456908 |
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V
Title | Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V PDF eBook |
Author | |
Publisher | |
Pages | |
Release | 2006 |
Genre | Microelectromechanical systems |
ISBN |
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X
Title | Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X PDF eBook |
Author | Sonia Garcia-Blanco |
Publisher | SPIE-International Society for Optical Engineering |
Pages | 256 |
Release | 2011 |
Genre | Microelectromechanical systems |
ISBN | 9780819484659 |
Includes Proceedings Vol. 7821
Special Section on Reliability, Packaging, Testing, and Characterization of MEMS and MOEMS II
Title | Special Section on Reliability, Packaging, Testing, and Characterization of MEMS and MOEMS II PDF eBook |
Author | Rajeshuni Ramesham |
Publisher | |
Pages | |
Release | 2010 |
Genre | |
ISBN |
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV
Title | Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV PDF eBook |
Author | Danelle Mary Tanner |
Publisher | SPIE-International Society for Optical Engineering |
Pages | 272 |
Release | 2005 |
Genre | Technology & Engineering |
ISBN | 9780819456908 |
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX
Title | Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX PDF eBook |
Author | Richard C. Kullberg |
Publisher | SPIE-International Society for Optical Engineering |
Pages | 344 |
Release | 2010 |
Genre | Microelectromechanical systems |
ISBN | 9780819479884 |
Includes Proceedings Vol. 7821
Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII
Title | Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII PDF eBook |
Author | Rajeshuni Ramesham |
Publisher | |
Pages | |
Release | 2013 |
Genre | Microelectromechanical systems |
ISBN |
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.