First volume of a 40-volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Raman spectroscopy for the characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume essential reading for research scientists in academia and industry.

Dr. Challa S.S.R. Kumar is Director of Nanofabrication and Nanomaterials at the Center for Advanced Microstructures and Devices at Louisiana State University in Baton Rouge, USA. He is also President and CEO of Magnano Technologies and has some years of industrial R & D experience working for Imperial Chemical Industries and United Breweries. His main research interests are the development of novel synthetic methods, including those based on microfluidic reactors, for the synthesis of multifunctional nanomaterials. Dr. Kumar is the winner of the 2006 Nano 50 Technology Award for his work in magnetic-based nanoparticles for cancer imaging and treatment. He is the editor and author of several books and journal articles, and a former editor of the Journal of Biomedical Nanotechnology.

Nanomaterials Characterization Techniques, Volume Two, part of an ongoing series, offers a detailed analysis of the different types of spectroscopic methods currently being used in nanocharacterization. These include, for example, the Raman spectroscopic method for the characterization of carbon nanotubes (CNTs). This book outlines the different kinds of spectroscopic tools being used for the characterization of nanomaterials and discusses under what conditions each should be used. The book is intended to cover all the major spectroscopic techniques for nanocharacterization, making it an important resource for both the academic community at the research level and the industrial community involved in nanomanufacturing. Explores how spectroscopy and X-ray-based nanocharacterization techniques are applied in modern industry Analyzes all the major spectroscopy and X-ray-based nanocharacterization techniques, allowing the reader to choose the best for their situation Presents a method-orientated approach that explains how to successfully use each technique

1. Provides a comprehensive understanding about physical and chemical characterization techniques of nanomaterials 2. Includes details about basic principles of each characterization technique with properly explained examples 3. Covers all important characterization techniques required for nanomaterial characterization 4. Discusses chemical and structural characterization techniques for nanomaterials with basic principles of each technique, how these techniques can be used for nanomaterial characterization, basic instrumentation details and the detailed examples of analysis of nanomaterials 5. Explores nanomaterial characterization in order to obtain accurate and precise details of structural and chemical properties of nanomaterial to do the analysis

This handbook gives a comprehensive overview about Raman spectroscopy for the characterization of nanomaterials. It is the first volume of a 40-volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar.

This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.

This book provides information on synthesis, properties, and applications of carbon nanomaterials. With novel materials, such as graphene (atomically flat carbon) or carbon onions (carbon nanospheres), the family of carbon nanomaterials is rapidly growing. This book provides a state-of-the-art overview and in-depth analysis of the most important ca