Coulomb Interactions in Particle Beams, Volume 223 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and computing methods used in all these domains, with this release exploring Coulomb Interactions in Particle Beams. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in the Advances in Imaging and Electron Physics series Updated release includes the latest information on Coulomb Interactions in Particle Beams

Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.

This book focuses on a fundamental feature of vacuum electronics: the strong interaction of the physics of electron beams and vacuum microwave electronics, including millimeter-wave electronics. The author guides readers from the roots of classical vacuum electronics to the most recent achievements in the field. Special attention is devoted to the physics and theory of relativistic beams and microwave devices, as well as the theory and applications of specific devices.