Progress in Nanoscale Characterization and Manipulation
Title | Progress in Nanoscale Characterization and Manipulation PDF eBook |
Author | Rongming Wang |
Publisher | Springer |
Pages | 511 |
Release | 2018-08-30 |
Genre | Science |
ISBN | 9811304548 |
This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
纳米表征与调控研究进展
Title | 纳米表征与调控研究进展 PDF eBook |
Author | |
Publisher | |
Pages | 665 |
Release | 2017 |
Genre | |
ISBN | 9787301283066 |
本书为中外物理学精品书系中高瞻系列里的一部。是由国内著名物理学家用英文编写的专著。主要内容是介绍近些年我国在纳米结构表征及其调控研究的最新成果.
Progress in Nanoscale and Low-Dimensional Materials and Devices
Title | Progress in Nanoscale and Low-Dimensional Materials and Devices PDF eBook |
Author | Hilmi Ünlü |
Publisher | Springer Nature |
Pages | 939 |
Release | 2022-10-18 |
Genre | Technology & Engineering |
ISBN | 3030934608 |
This book describes most recent progress in the properties, synthesis, characterization, modelling, and applications of nanomaterials and nanodevices. It begins with the review of the modelling of the structural, electronic and optical properties of low dimensional and nanoscale semiconductors, methodology of synthesis, and characterization of quantum dots and nanowires, with special attention towards Dirac materials, whose electrical conduction and sensing properties far exceed those of silicon-based materials, making them strong competitors. The contributed reviews presented in this book touch on broader issues associated with the environment, as well as energy production and storage, while highlighting important achievements in materials pertinent to the fields of biology and medicine, exhibiting an outstanding confluence of basic physical science with vital human endeavor. The subjects treated in this book are attractive to the broader readership of graduate and advanced undergraduate students in physics, chemistry, biology, and medicine, as well as in electrical, chemical, biological, and mechanical engineering. Seasoned researchers and experts from the semiconductor/device industry also greatly benefit from the book’s treatment of cutting-edge application studies.
Nanocharacterization Techniques
Title | Nanocharacterization Techniques PDF eBook |
Author | Osvaldo de Oliveira Jr |
Publisher | William Andrew |
Pages | 224 |
Release | 2017-03-18 |
Genre | Technology & Engineering |
ISBN | 0323497799 |
Nanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail. This book is an important reference for materials scientists and engineers looking for a through analysis of nanocharacterization techniques in order to establish which is best for their needs. - Includes a detailed analysis of different nanocharacterization techniques, allowing readers to explore which one is best for their particular needs - Provides examples of how each characterization technique has been used, giving readers a greater understanding of how each technique can be profitably used - Covers the mathematical background needed to utilize each of these techniques to their best effect, meaning that readers can gain a full understanding of the theoretical principles behind each technique covered - Serves as an important, go-to reference for materials scientists and engineers
Characterization of Nanostructures
Title | Characterization of Nanostructures PDF eBook |
Author | Sverre Myhra |
Publisher | CRC Press |
Pages | 353 |
Release | 2012-06-12 |
Genre | Science |
ISBN | 1439854157 |
The techniques and methods that can be applied to materials characterization on the microscale are numerous and well-established. Divided into two parts, Characterization of Nanostructures provides thumbnail sketches of the most widely used techniques and methods that apply to nanostructures, and discusses typical applications to single nanoscale objects, as well as to ensembles of such objects. Section I: Techniques and Methods overviews the physical principles of the main techniques and describes those operational modes that are most relevant to nanoscale characterization. It provides sufficient technical detail so that readers and prospective users can gain an appreciation of the strengths and limitations of particular techniques. The section covers both mainstream and less commonly used techniques. Section II: Applications of Techniques to Structures of Different Dimensionalities and Functionalities deals with the methods for materials characterization of generic types of systems, using carefully chosen illustrations from the literature. Each chapter begins with a brief description of the materials and supplies a context for the methods for characterization. The volume concludes with a series of flow charts and brief descriptions of tactical issues. The authors focus on the needs of the research laboratory but also address those of quality control, industrial troubleshooting, and online analysis. Characterization of Nanostructures describes those techniques and their operational modes that are most relevant to nanoscale characterization. It is especially relevant to systems of different dimensionalities and functionalities. The book builds a bridge between generalists, who play vital roles in the post-disciplinary area of nanotechnology, and specialists, who view themselves as more in the context of the discipline.
Nanoscale Phenomena in Ferroelectric Thin Films
Title | Nanoscale Phenomena in Ferroelectric Thin Films PDF eBook |
Author | Seungbum Hong |
Publisher | Springer Science & Business Media |
Pages | 294 |
Release | 2013-11-27 |
Genre | Technology & Engineering |
ISBN | 1441990445 |
This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It comprises two main parts, i.e. electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well known le'adingexperts both in relevant academia and industry over the world (U.S., Japan, Germany, Switzerland, Korea) were invited to contribute to each chapter. The first part under the title of electrical characterization in nanoscale ferroelectric capacitors starts with Chapter 1, "Testing and characterization of ferroelectric thin film capacitors," written by Dr. I. K. Yoo. The author provides a comprehensive review on basic concepts and terminologies of ferroelectric properties and their testing methods. This chapter also covers reliability issues in FeRAMs that are crucial for commercialization of high density memory products. In Chapter 2, "Size effects in ferroelectric film capacitors: role ofthe film thickness and capacitor size," Dr. I. Stolichnov discusses the size effects both in in-plane and out-of-plane dimensions of the ferroelectric thin film. The author successfully relates the electric performance and domain dynamics with proposed models of charge injection and stress induced phase transition. The author's findings present both a challenging problem and the clue to its solution of reliably predicting the switching properties for ultra-thin ferroelectric capacitors. In Chapter 3, "Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy," Prof. A.
Nanoscale Phenomena
Title | Nanoscale Phenomena PDF eBook |
Author | Zikang Tang |
Publisher | Springer Science & Business Media |
Pages | 246 |
Release | 2007-11-22 |
Genre | Technology & Engineering |
ISBN | 0387730486 |
This book collects selected lectures from the Third Workshop of the Croucher Advanced Study Institute on Nano Science and Technology, and showcases contributions from world-renowned researchers. The book presents in-depth articles on the latest developments in nanomaterials and nanotechnology, and provides a cross-disciplinary perspective covering physics and biophysics, chemistry, materials science, and engineering.