Proceedings of the Symposium on Interconnect and Contact Metallization
Title | Proceedings of the Symposium on Interconnect and Contact Metallization PDF eBook |
Author | Harzara S. Rathore |
Publisher | The Electrochemical Society |
Pages | 292 |
Release | 1998 |
Genre | Computers |
ISBN | 9781566771849 |
Proceedings of the Symposium on Multilevel Metallization, Interconnection, and Contact Technologies
Title | Proceedings of the Symposium on Multilevel Metallization, Interconnection, and Contact Technologies PDF eBook |
Author | L. B. Rothman |
Publisher | |
Pages | 288 |
Release | 1987 |
Genre | Electronics |
ISBN |
Proceedings of the Symposia on Interconnects, Contact Metallization, and Multilevel Metallization and Reliability for Semiconductor Devices, Interconnects, and Thin Insulator Materials
Title | Proceedings of the Symposia on Interconnects, Contact Metallization, and Multilevel Metallization and Reliability for Semiconductor Devices, Interconnects, and Thin Insulator Materials PDF eBook |
Author | T. O. Herndon |
Publisher | |
Pages | 520 |
Release | 1993 |
Genre | Technology & Engineering |
ISBN |
Interconnect and Contact Metallization for ULSI
Title | Interconnect and Contact Metallization for ULSI PDF eBook |
Author | G. S. Mathad |
Publisher | The Electrochemical Society |
Pages | 358 |
Release | 2000 |
Genre | Science |
ISBN | 9781566772549 |
Proceedings of the Symposia on Electrochemical Processing in ULSI Fabrication I
Title | Proceedings of the Symposia on Electrochemical Processing in ULSI Fabrication I PDF eBook |
Author | Electrochemical Society. Dielectric Science and Technology Division |
Publisher | |
Pages | 290 |
Release | 1999 |
Genre | Science |
ISBN |
Proceedings of the Symposium on Electron and Ion Beam Science and Technology; International Conference
Title | Proceedings of the Symposium on Electron and Ion Beam Science and Technology; International Conference PDF eBook |
Author | |
Publisher | |
Pages | 720 |
Release | 1978 |
Genre | Electron beams |
ISBN |
Electromigration in Metals
Title | Electromigration in Metals PDF eBook |
Author | Paul S. Ho |
Publisher | Cambridge University Press |
Pages | 433 |
Release | 2022-05-12 |
Genre | Science |
ISBN | 1107032385 |
Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics and building to advanced methodologies, this book enables the reader to develop highly reliable on-chip wiring stacks and power grids. Through a detailed review on the role of microstructure, interfaces and processing on electromigration reliability, as well as characterisation, testing and analysis, the book follows the development of on-chip interconnects from microscale to nanoscale. Practical modeling methodologies for statistical analysis, from simple 1D approximation to complex 3D description, can be used for step-by-step development of reliable on-chip wiring stacks and industrial-grade power/ground grids. This is an ideal resource for materials scientists and reliability and chip design engineers.