Presenting a comprehensive overview of the design automation algorithms, tools, and methodologies used to design integrated circuits, the Electronic Design Automation for Integrated Circuits Handbook is available in two volumes. The second volume, EDA for IC Implementation, Circuit Design, and Process Technology, thoroughly examines real-time logic to GDSII (a file format used to transfer data of semiconductor physical layout), analog/mixed signal design, physical verification, and technology CAD (TCAD). Chapters contributed by leading experts authoritatively discuss design for manufacturability at the nanoscale, power supply network design and analysis, design modeling, and much more. Save on the complete set.

This text addresses the design methodologies and CAD tools available for the systematic design and design automation of analogue integrated circuits. Two complementary approaches discussed increase analogue design productivity, demonstrated throughout using design times of the different design experiments undertaken.

With the development of Very-Deep Sub-Micron technologies, process variability is becoming increasingly important and is a very important issue in the design of complex circuits. Process variability is the statistical variation of process parameters, meaning that these parameters do not have always the same value, but become a random variable, with a given mean value and standard deviation. This effect can lead to several issues in digital circuit design. The logical consequence of this parameter variation is that circuit characteristics, as delay and power, also become random variables. Because of the delay variability, not all circuits will now have the same performance, but some will be faster and some slower. However, the slowest circuits may be so slow that they will not be appropriate for sale. On the other hand, the fastest circuits that could be sold for a higher price can be very leaky, and also not very appropriate for sale. A main consequence of power variability is that the power consumption of some circuits will be different than expected, reducing reliability, average life expectancy and warranty of products. Sometimes the circuits will not work at all, due to reasons associated with process variations. At the end, these effects result in lower yield and lower profitability. To understand these effects, it is necessary to study the consequences of variability in several aspects of circuit design, like logic gates, storage elements, clock distribution, and any other that can be affected by process variations. The main focus of this book will be storage elements.

Compact Models for Integrated Circuit Design: Conventional Transistors and Beyond provides a modern treatise on compact models for circuit computer-aided design (CAD). Written by an author with more than 25 years of industry experience in semiconductor processes, devices, and circuit CAD, and more than 10 years of academic experience in teaching compact modeling courses, this first-of-its-kind book on compact SPICE models for very-large-scale-integrated (VLSI) chip design offers a balanced presentation of compact modeling crucial for addressing current modeling challenges and understanding new models for emerging devices. Starting from basic semiconductor physics and covering state-of-the-art device regimes from conventional micron to nanometer, this text: Presents industry standard models for bipolar-junction transistors (BJTs), metal-oxide-semiconductor (MOS) field-effect-transistors (FETs), FinFETs, and tunnel field-effect transistors (TFETs), along with statistical MOS models Discusses the major issue of process variability, which severely impacts device and circuit performance in advanced technologies and requires statistical compact models Promotes further research of the evolution and development of compact models for VLSI circuit design and analysis Supplies fundamental and practical knowledge necessary for efficient integrated circuit (IC) design using nanoscale devices Includes exercise problems at the end of each chapter and extensive references at the end of the book Compact Models for Integrated Circuit Design: Conventional Transistors and Beyond is intended for senior undergraduate and graduate courses in electrical and electronics engineering as well as for researchers and practitioners working in the area of electron devices. However, even those unfamiliar with semiconductor physics gain a solid grasp of compact modeling concepts from this book.

The physical design flow of any project depends upon the size of the design, the technology, the number of designers, the clock frequency, and the time to do the design. As technology advances and design-styles change, physical design flows are constantly reinvented as traditional phases are removed and new ones are added to accommodate changes in

This excellent survey of state-of-the-art techniques discusses the MTCMOS technology that has emerged as an increasingly popular technique to control the escalating leakage power, while maintaining high performance. It addresses the leakage problem in a number of designs for combinational, sequential, dynamic and current-steering logic.

Low-Energy FPGAs: Architecture and Design is a primary resource for both researchers and practicing engineers in the field of digital circuit design. The book addresses the energy consumption of Field-Programmable Gate Arrays (FPGAs). FPGAs are becoming popular as embedded components in computing platforms. The programmability of the FPGA can be used to customize implementations of functions on an application basis. This leads to performance gains, and enables reuse of expensive silicon. Chapter 1 provides an overview of digital circuit design and FPGAs. Chapter 2 looks at the implication of deep-submicron technology onFPGA power dissipation. Chapter 3 describes the exploration environment to guide and evaluate design decisions. Chapter 4 discusses the architectural optimization process to evaluate the trade-offs between the flexibility of the architecture, and the effect on the performance metrics. Chapter 5 reviews different circuit techniques to reduce the performance overhead of some of the dominant components. Chapter 6 shows methods to configure FPGAs to minimize the programming overhead. Chapter 7 addresses the physical realization of some of the critical components and the final implementation of a specific low-energy FPGA. Chapter 8 compares the prototype array to an equivalent commercial architecture.