Since the first edition of this book was published early in 1970, three major developments have occurred in the field of x-ray spectrochemical analysis. First, wavelength-dispersive spectrometry, in 1970 already securely established among instrumental analytical methods, has matured. Highly sophisticated, miniaturized, modular, solid-state circuitry has replaced elec tron-tube circuitry in the readout system. Computers are now widely used to program and control fully automated spectrometers and to store, process, and compute analytical concentrations directly and immediately from ac cumulated count data. Matrix effects have largely yielded to mathematical treatment. The problems associated with the ultralong-wavelength region have been largely surmounted. Indirect (association) methods have extended the applicability of x-ray spectrometry to the entire periodic table and even to certain classes of compounds. Modern commercial, computerized, auto matic, simultaneous x-ray spectrometers can index up to 60 specimens in turn into the measurement position and for each collect count data for up to 30 elements and read out the analytical results in 1--4 min-all corrected for absorption-enhancement and particle-size or surface-texture effects and wholly unattended. Sample preparation has long been the time-limiting step in x-ray spectrochemical analysis. Second, energy-dispersive spectrometry, in 1970 only beginning to assume its place among instrumental analytical methods, has undergone phenomenal development and application and, some believe, may supplant wavelength spectrometry for most applications in the foreseeable future.

X-ray fluorescence spectrometry has been an established, widely practiced method of instrumental chemical analysis for about 30 years. However, although many colleges and universities offer full-semester courses in optical spectrometric methods of instrumental analysis and in x-ray dif fraction, very few offer full courses in x-ray spectrometric analysis. Those courses that are given are at the graduate level. Consequently, proficiency in this method must still be acquired by: self-instruction; on-the-job training and experience; "workshops" held by the x-ray instrument manu facturers; the one- or two-week summer courses offered by a few uni versities; and certain university courses in analytical and clinical chemistry, metallurgy, mineralogy. geology, ceramics. etc. that devote a small portion of their time to applications of x-ray spectrometry to those respective disciplines. Moreover, with all due respect to the books on x-ray spectrometric analysis now in print, in my opinion none is really suitable as a text or manual for beginners in the discipline. In 1968, when I undertook the writing of the first edition of my previous book, Principles and Practice of X-Ray Spectrometric Analysis,* my objective was to provide a student text. However, when all the material was compiled, I decided to provide a more comprehensive book, which was also lacking at that time. Although that book explains principles, instrumentation, and methods at the begin ner's level, this material is distributed throughout a mass of detail and more advanced material.

X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.

without an appreciation of what happens in between. The techniques available for the chemical analysis of silicate rocks have undergone a revolution over the last 30 years. However, to use an analytical technique most effectively, No longer is the analytical balance the only instrument used it is essential to understand its analytical characteristics, in for quantitative measurement, as it was in the days of classi particular the excitation mechanism and the response of the cal gravimetric procedures. A wide variety of instrumental signal detection system. In this book, these characteristics techniques is now commonly used for silicate rock analysis, have been described within a framework of practical ana lytical aplications, especially for the routine multi-element including some that incorporate excitation sources and detec tion systems that have been developed only in the last few analysis of silicate rocks. All analytical techniques available years. These instrumental developments now permit a wide for routine silicate rock analysis are discussed, including range of trace elements to be determined on a routine basis. some more specialized procedures. Sufficient detail is In parallel with these exciting advances, users have tended included to provide practitioners of geochemistry with a firm to become more remote from the data production process. base from which to assess current performance, and in some This is, in part, an inevitable result of the widespread intro cases, future developments.

X-ray fluorescenct" spectrometry is now widely accepted as a highly versatile and potentially accurate method of instrumental elemental analysis and so it is somewhat surprising that although the volume of published work dealing with the technique is high the number of textbooks dealing exclusively with its application is relatively few. Without wishing to detract from the excellence of the textbooks which are already available we have both felt for some time, that a great need exists for a book dealing with the more practical aspects of the subject. For a number of years we have been associated with the provision and arrangement of X-ray schools for the training of new X-ray spectroscopists as well as in the organisation of conferences and sym posia whose aims have been to keep the more experienced workers abreast with the latest developments in instrumentation and techniques. In all of these ventures we have found a considerable dearth of reference work dealing with the reasons why an X-ray method has not succeeded as opposed to the multitude of success stories which regularly saturate the scientific press. In this book, which is based on lecture notes from well established courses in X-ray fluorescence spectrometry, we have tried to cover all of the more usual practical difficulties experienced in the application of the method and we have endeavoured to keep the amount of purely theoretical data at a minimum.