The conventional method used in attribute control charts is the Shewhart three sigma limits. The implicit assumption of the Normal distribution in this approach is not appropriate for skewed distributions such as Poisson, Geometric and Negative Binomial. Normal approximations perform poorly in the tail area of the these distributions. In this research, a type of attribute control chart is introduced to monitor the processes that provide count data. The economic objective of this chart is to minimize the cost of its errors which is determined by the designer. This objective is a linear function of type I and II errors. The proposed control chart can be applied to Poisson, Geometric and Negative Binomial as the underlying distribution of count data. Control limits in this chart is calculated optimally since it is based on the probability distribution of the data and can detect a directional shift in the process rate. Some numerical results for the optimal design of the proposed control chart are provided. The expected cost of the control chart is compared to that of a one sided c chart. The effects of changing the available parameters on the cost, errors and the optimal limits of the proposed control chart are shown graphically.

This paper will introduce the neutrosophic COM-Poisson (NCOM-Poisson) distribution. Then, the design of the attribute control chart using the NCOM-Poisson distribution is given.The structure of the control chart under the neutrosophic statistical interval methodwill be given.Thealgorithm to determine the average run length under neutrosophic statistical interval systemwill be given. The performance of the proposed control chart is compared with the chart based on classical statistics in terms of neutrosophic average run length (NARL). A simulation study and a real example are also added. From the comparison of the proposed control chart with the existing chart, it is concluded that the proposed control chart is more efficient in detecting a shift in the process. Therefore, the proposed control chart will be helpful in minimizing the defective product. In addition, the proposed control chart is more adequate and effective to apply in uncertainty environment.

Control charts are widely used in industry to monitor processes that are far from Zero-Defect (ZD), and their use in a near Zero-Defect manufacturing environment poses many problems. This book presents techniques of using control charts for high-quality processes, and some recent findings and applications of statistical control chart techniques for ZD processes are presented. A powerful technique based on counting of the cumulative conforming (CCC) items between two nonconforming ones is discussed in detail. Extensions of the CCC chart are described, as well as applications of cumulative sum and exponentially weighted moving average techniques to CCC-related data, multivariate methods, economic design of control chart procedures, and modeling and analysis of trended but regularly adjusted processes. Many examples, charts, and procedures, are presented throughout the book, and references are provided for those interested in exploring the details. A number of questions and issues are posed for further investigations. Researchers and students may find many ideas in this book useful in their academic work, as a foundation is laid for the exploration of many further theoretical and practical issues.

Praise for the First Edition "This book . . . is a significant addition to the literature onstatistical practice . . . should be of considerable interest tothose interested in these topics."—International Journal ofForecasting Recent research has shown that monitoring techniques alone areinadequate for modern Statistical Process Control (SPC), and thereexists a need for these techniques to be augmented by methods thatindicate when occasional process adjustment is necessary.Statistical Control by Monitoring and Adjustment, Second Editionpresents the relationship among these concepts and elementary ideasfrom Engineering Process Control (EPC), demonstrating how thepowerful synergistic association between SPC and EPC can solvenumerous problems that are frequently encountered in processmonitoring and adjustment. The book begins with a discussion of SPC as it was originallyconceived by Dr. Walter A. Shewhart and Dr. W. Edwards Deming.Subsequent chapters outline the basics of the new integration ofSPC and EPC, which is not available in other related books.Thorough coverage of time series analysis for forecasting, processdynamics, and non-stationary models is also provided, and thesesections have been carefully written so as to require only anelementary understanding of mathematics. Extensive graphicalexplanations and computational tables accompany the numerousexamples that are provided throughout each chapter, and a helpfulselection of problems and solutions further facilitatesunderstanding. Statistical Control by Monitoring and Adjustment, Second Editionis an excellent book for courses on applied statistics andindustrial engineering at the upper-undergraduate and graduatelevels. It also serves as a valuable reference for statisticiansand quality control practitioners working in industry.

Praise for the Second Edition "As a comprehensive statistics reference book for quality improvement, it certainly is one of the best books available." —Technometrics This new edition continues to provide the most current, proven statistical methods for quality control and quality improvement The use of quantitative methods offers numerous benefits in the fields of industry and business, both through identifying existing trouble spots and alerting management and technical personnel to potential problems. Statistical Methods for Quality Improvement, Third Edition guides readers through a broad range of tools and techniques that make it possible to quickly identify and resolve both current and potential trouble spots within almost any manufacturing or nonmanufacturing process. The book provides detailed coverage of the application of control charts, while also exploring critical topics such as regression, design of experiments, and Taguchi methods. In this new edition, the author continues to explain how to combine the many statistical methods explored in the book in order to optimize quality control and improvement. The book has been thoroughly revised and updated to reflect the latest research and practices in statistical methods and quality control, and new features include: Updated coverage of control charts, with newly added tools The latest research on the monitoring of linear profiles and other types of profiles Sections on generalized likelihood ratio charts and the effects of parameter estimation on the properties of CUSUM and EWMA procedures New discussions on design of experiments that include conditional effects and fraction of design space plots New material on Lean Six Sigma and Six Sigma programs and training Incorporating the latest software applications, the author has added coverage on how to use Minitab software to obtain probability limits for attribute charts. new exercises have been added throughout the book, allowing readers to put the latest statistical methods into practice. Updated references are also provided, shedding light on the current literature and providing resources for further study of the topic. Statistical Methods for Quality Improvement, Third Edition is an excellent book for courses on quality control and design of experiments at the upper-undergraduate and graduate levels. the book also serves as a valuable reference for practicing statisticians, engineers, and physical scientists interested in statistical quality improvement.

While many books on quality espouse the Taguchi loss function, they do not examine its impact on statistical quality control (SQC). But using the Taguchi loss function sheds new light on questions relating to SQC and calls for some changes. This book covers SQC in a way that conforms with the need to minimize loss. Subjects often not covered elsewhere include: (i) measurements, (ii) determining how many points to sample to obtain reliable control charts (for which purpose a new graphic tool, diffidence charts, is introduced), (iii) the connection between process capability and tolerances, (iv) how to adapt Deming's kp rule to quadratic loss, (v) how to adjust without tampering. We also discuss the efficiency of various statistics and how control chart constants are derived.