Presents a fully updated, self-contained textbook covering the core theory and practice of both classical and modern optical microscopy techniques.

This fully updated, self-contained textbook covering modern optical microscopy equips students with a solid understanding of the theory underlying a range of advanced techniques. Two new chapters cover pump-probe techniques, and imaging in scattering media, and additional material throughout covers light-sheet microscopy, image scanning microscopy, and much more. An array of practical techniques are discussed, from classical phase contrast and confocal microscopy, to holographic, structured illumination, multi-photon, and coherent Raman microscopy, and optical coherence tomography. Fundamental topics are also covered, including Fourier optics, partial coherence, 3D imaging theory, statistical optics, and the physics of scattering and fluorescence. With a wealth of end-of-chapter problems, and a solutions manual for instructors available online, this is an invaluable book for electrical engineering, biomedical engineering, and physics students taking graduate courses on optical microscopy, as well as advanced undergraduates, professionals, and researchers looking for an accessible introduction to the field.

Choice Recommended Title, March 2020 Optical microscopy is used in a vast range of applications ranging from materials engineering to in vivo observations and clinical diagnosis, and thanks to the latest advances in technology, there has been a rapid growth in the number of methods available. This book is aimed at providing users with a practical guide to help them select, and then use, the most suitable method for their application. It explores the principles behind the different forms of optical microscopy, without the use of complex maths, to provide an understanding to help the reader utilise a specific method and then interpret the results. Detailed physics is provided in boxed sections, which can be bypassed by the non-specialist. It is an invaluable tool for use within research groups and laboratories in the life and physical sciences, acting as a first source for practical information to guide less experienced users (or those new to a particular methodology) on the range of techniques available. Features: The first book to cover all current optical microscopy methods for practical applications Written to be understood by a non-optical expert with inserts to provide the physical science background Brings together conventional widefield and confocal microscopy, with advanced non-linear and super resolution methods, in one book To learn more about the author please visit here.

Optical microscopy is one of the most valuable--but under utilized--tools for analyzing fiber reinforced polymer matrix composites. This hands-on instructional book covers everything: sample preparation, microscopic techniques, and applications. The power of optical microscopy to study the microstructure of these heterogeneous, anisotropic materials is illustrated with over 180 full color images.

This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. The book concentrates mainly on two instruments: the Confocal Scanning Optical Microscope (CSOM), and the Optical Interference Microscope (OIM). A comprehensive discussion of the theory and design of the Near-Field Scanning Optical Microscope (NSOM) is also given. The text discusses the practical aspects of building a confocal scanning optical microscope or optical interference microscope, and the applications of these microscopes to phase imaging, biological imaging, and semiconductor inspection and metrology.A comprehensive theoretical discussion of the depth and transverse resolution is given with emphasis placed on the practical results of the theoretical calculations and how these can be used to help understand the operation of these microscopes. - Provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers - Explains many practical applications of scanning optical and interference microscopy in such diverse fields as biology and semiconductor metrology - Discusses in theoretical terms the origin of the improved depth and transverse resolution of scanning optical and interference microscopes with emphasis on the practical results of the theoretical calculations - Considers the practical aspects of building a confocal scanning or interference microscope and explores some of the design tradeoffs made for microscopes used in various applications - Discusses the theory and design of near-field optical microscopes - Explains phase imaging in the scanning optical and interference microscopes

This text draws together the fields of optical microscopy and optical data storage, in a unique compilation of valuable and novel scientific work that is scarcely to be found elsewhere. The contributing authors are unquestioned leaders of their respective fields.

Since Sorby published his observations on the structures of steels in 1863, the optical microscope has become one of the most widely used and versatile instruments for examining the structures of engineering materials. Moreover, to examine the diverse range of materials encountered, it must be used in both the reflected-light and transmitted-light forms, and with polarized light. It is complementary to, but not superseded by, the wide range of electron-optical instruments that are now used. Despite its extensive use, it has been described as the most misused, abused, and misunderstood of scientific instruments, for it will produce an image of a sort no matter how badly it is used. To use it effectively, even in its simplest applications, a knowledge of the simple theory of the microscope is necessary, for the theory shows and explains how it should be used. Thus my aim has been to give a simple and, where possible, quantitative account of both the theory and the use of the microscope, including the various special techniques for which it can be used. But, no matter how effectively the microscope is used, if the specimen is inadequately prepared the results of examination will be of doubtful value.