Investigating the incessant technology growth and the even higher complexity of engineering systems, one of the crucial requirements to confidently steer both scientific and industrial challenges is to identify an appropriate measurement approach. A general process can be considered effective and under control if the following elements are consciously and cyclically managed: numeric target, adequate tools, output analysis, and corrective actions. The role of metrology is to rigorously harmonize this virtuous circle, providing guidance in terms of instruments, standards, and techniques to improve the robustness and the accuracy of the results. This book is designed to offer an interdisciplinary experience into the science of measurement, not only covering high-level measurement strategies but also supplying analytical details and experimental setups.

In the last few years the automobile design process is required to become more responsible and responsibly related to environmental needs. Basing the automotive design not only on the appearance, the visual appearance of the vehicle needs to be thought together and deeply integrated with the power developed by the engine. The purpose of this book is to try to present the new technologies development scenario, and not to give any indication about the direction that should be given to the research in this complex and multi-disciplinary challenging field.

The goal of acceptable quality, cost, and time is a decisive challenge in every engineering development process. To be familiar with metrology requires choosing the best combination of techniques, standards, and tools to control a project from advanced simulations to final performance measurements and periodic inspections. This book contains a cluster of chapters from international academic authors who provide a meticulous way to discover the impacts of metrology in both theoretical and application fields. The approach is to discuss the key aspects of a selection of untraditional metrological topics, covering the analysis procedures and set of solutions obtained from experimental studies.

This book presents a systematic and comprehensive exposition of the theory of measurement accuracy and provides solutions that fill significant and long-standing gaps in the classical theory. It eliminates the shortcomings of the classical theory by including methods for estimating accuracy of single measurements, the most common type of measurement. The book also develops methods of reduction and enumeration for indirect measurements, which do not require Taylor series and produce a precise solution to this problem. It produces grounded methods and recommendations for summation of errors. The monograph also analyzes and critiques two foundation metrological documents, the International Vocabulary of Metrology (VIM) and the Guide to the Expression of Uncertainty in Measurement (GUM), and discusses directions for their revision. This new edition adds a step-by-step guide on how to evaluate measurement accuracy and recommendations on how to calculate systematic error of multiple measurements. There is also an extended section on the method of reduction, which provides an alternative to the least-square method and the method of enumeration. Many sections are also rewritten to improve the structure and usability of the material. The 3rd edition reflects the latest developments in metrology and offers new results, and it is designed to be accessible to readers at various levels and positions, including scientists, engineers, and undergraduate and graduate students. By presenting material from a practical perspective and offering solutions and recommendations for problems that arise in conducting real-life measurements, author Semyon Rabinovich offers an invaluable resource for scientists in any field.

"Evaluating Measurement Accuracy" is intended for anyone who is concerned with measurements in any field of science or technology. It reflects the latest developments in metrology and offers new results, but is designed to be accessible to readers at different levels: meteorologists, engineers and experimental scientists who use measurements as tools in their professions, graduate and undergraduate students in the natural sciences and engineering, and technicians performing complex measurements in industry, quality control, and trade. The material of the book is presented from the practical perspective and offers solutions and recommendations for problems that arise in conducting real-life measurements. This inclusion is a notable and unique aspect of this title as complex measurements done in industry and trade are often neglected in metrological literature, leaving the practitioners of these measurements to devise their own ad-hoc techniques.

The field of large-scale dimensional metrology (LSM) deals with objects that have linear dimensions ranging from tens to hundreds of meters. It has recently attracted a great deal of interest in many areas of production, including the automotive, railway, and shipbuilding sectors. Distributed Large-Scale Dimensional Metrology introduces a new paradigm in this field that reverses the classical metrological approach: measuring systems that are portable and can be easily moved around the location of the measured object, which is preferable to moving the object itself. Distributed Large-Scale Dimensional Metrology combines the concepts of distributed systems and large scale metrology at the application level. It focuses on the latest insights and challenges of this new generation of systems from the perspective of the designers and developers. The main topics are: coverage of measuring area, sensors calibration, on-line diagnostics, probe management, and analysis of metrological performance. The general descriptions of each topic are further enriched by specific examples concerning the use of commercially available systems or the development of new prototypes. This will be particularly useful for professional practitioners such as quality engineers, manufacturing and development engineers, and procurement specialists, but Distributed Large-Scale Dimensional Metrology also has a wealth of information for interested academics.