The chapter is intended to provide the reader with means to reduce low-frequency noise in Metal-Oxide-Semiconductor Field-Effect-Transistor (MOSFET). It is demonstrated that low-resistivity source and drain electrodes can greatly lower the low-frequency noise level by suppressing their contribution to the total noise. Furthermore, new plasma processes having the advantages to work at low electron temperature can achieve a further reduction, thanks to the fabrication of a better gate oxide and to a reduction of damages generally induced by conventional plasma processes. Reducing the impact of the traps on the carrier flowing inside the channel by burying the channel can also achieve a reduction of the noise level, but unfortunately at the cost of a degradation of the electrical performances. Finally, the noise analysis of the low-frequency noise in accumulation-mode MOSFETs showed that these newly developed devices have a lower noise level than conventional structures, which, in addition to their superiority in term of electrical performances, establishes them as a serious platform for the next Complementary Metal-Oxide-Semiconductor Field-Effect-Transistor (CMOS) technology.

This is an introduction to noise, describing fundamental noise sources and basic circuit analysis, discussing characterization of low-frequency noise and offering practical advice that bridges concepts of noise theory and modelling, characterization, CMOS technology and circuits. The text offers the latest research, reviewing the most recent publications and conference presentations. The book concludes with an introduction to noise in analog/RF circuits and describes how low-frequency noise can affect these circuits.

The adverse impacts from excess noise on human health and daily activities have accelerated at an alarming rate over the last few decades. This has prompted significant research into noise attenuation and mitigation of these unwanted effects. This book is a collection of works from eminent researchers from around the world, who address the aforementioned issues. It provides the most up-to-date information on current work being conducted in the field of noise pollution and is of value to a wide range of students, engineers, scientists and industry consultants who wish to further understand current methodologies and emerging concepts.

This is an introduction to noise, describing fundamental noise sources and basic circuit analysis, discussing characterization of low-frequency noise and offering practical advice that bridges concepts of noise theory and modelling, characterization, CMOS technology and circuits. The text offers the latest research, reviewing the most recent publications and conference presentations. The book concludes with an introduction to noise in analog/RF circuits and describes how low-frequency noise can affect these circuits.

With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circuit feature sizes are increasing. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. The inherent randomness of materials used in fabrication at nanoscopic scales means that performance will be increasingly variable, not only from die-to-die but also within each individual die. Parametric variability will be compounded by degradation in nanoscale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. In an attempt to address these issues, Low-Power High-Resolution Analog-to-Digital Converters specifically focus on: i) improving the power efficiency for the high-speed, and low spurious spectral A/D conversion performance by exploring the potential of low-voltage analog design and calibration techniques, respectively, and ii) development of circuit techniques and algorithms to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover errors continuously. The feasibility of the described methods has been verified by measurements from the silicon prototypes fabricated in standard 180nm, 90nm and 65nm CMOS technology.

It is a great honor to provide an introduction for Dr. Frank Op 't Eynde's and Dr. Willy Sansen's book "Analog Interfaces for Digital Signal Processing Systems". The field of analog integrated circuit design is undergoing rapid evolution. The pervasiveness of digital processing has considerably modified the micro-system architectures: the analog part of complex mixed systems is more and more pushed at the boundary limits of the processing chain. Moreover, the increased performance of digital circuits, in terms of accuracy and speed, are making the specification requirements of analog circuits very strict. In addition to this, the technology, supply voltage and power consumption of analog circuits must be compatible with those, typical for digital circuits. Therefore, in a few words, analog circuits are becoming complex and specialised interfaces between the real world and digital signal processing domains. This technological evolution should be accompanied by an equivalently fast evolution in designer competencies. Knowledge of complicated signal handling should be quickly replaced by know-how of simple but very accurate and very fast signal processing and a solid background in data conversion techniques. All of this through the use of the CMOS (and possibly BiCMOS) technology.

Unlike books currently on the market, this book attempts to satisfy two goals: combine circuits and electronics into a single, unified treatment, and establish a strong connection with the contemporary world of digital systems. It will introduce a new way of looking not only at the treatment of circuits, but also at the treatment of introductory coursework in engineering in general. Using the concept of ''abstraction,'' the book attempts to form a bridge between the world of physics and the world of large computer systems. In particular, it attempts to unify electrical engineering and computer science as the art of creating and exploiting successive abstractions to manage the complexity of building useful electrical systems. Computer systems are simply one type of electrical systems. +Balances circuits theory with practical digital electronics applications.+Illustrates concepts with real devices.+Supports the popular circuits and electronics course on the MIT OpenCourse Ware from which professionals worldwide study this new approach.+Written by two educators well known for their innovative teaching and research and their collaboration with industry.+Focuses on contemporary MOS technology.