National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000

National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000
Title National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000 PDF eBook
Author
Publisher
Pages 160
Release 2000
Genre
ISBN

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National Semiconductor Metrology Program

National Semiconductor Metrology Program
Title National Semiconductor Metrology Program PDF eBook
Author National Institute of Standards and Technology (U.S.)
Publisher
Pages 160
Release 2000
Genre Semiconductors
ISBN

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National Semiconductor Metrology Program

National Semiconductor Metrology Program
Title National Semiconductor Metrology Program PDF eBook
Author National Semiconductor Metrology Program (U.S.)
Publisher
Pages 160
Release 2000
Genre Semiconductors
ISBN

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National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999

National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999
Title National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999 PDF eBook
Author
Publisher
Pages 148
Release 1999
Genre
ISBN

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Monthly Catalog of United States Government Publications

Monthly Catalog of United States Government Publications
Title Monthly Catalog of United States Government Publications PDF eBook
Author
Publisher
Pages 1328
Release 2003
Genre Government publications
ISBN

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Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results (rev. Ed. )

Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results (rev. Ed. )
Title Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results (rev. Ed. ) PDF eBook
Author Barry N. Taylor
Publisher DIANE Publishing
Pages 25
Release 2009-11
Genre Science
ISBN 1437915566

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Results of measurements and conclusions derived from them constitute much of the technical information produced by the National Institute of Standards and Technology (NIST). In July 1992 the Director of NIST appointed an Ad Hoc Committee on Uncertainty Statements and charged it with recommending a policy on this important topic. The Committee concluded that the CIPM approach could be used to provide quantitative expression of measurement that would satisfy NIST¿s customers¿ requirements. NIST initially published a Technical Note on this issue in Jan. 1993. This 1994 edition addresses the most important questions raised by recipients concerning some of the points it addressed and some it did not. Illustrations.

First Text Retrieval Conference (TREC-1)

First Text Retrieval Conference (TREC-1)
Title First Text Retrieval Conference (TREC-1) PDF eBook
Author D. K. Harman
Publisher DIANE Publishing
Pages 527
Release 1995-10
Genre
ISBN 0788125214

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Held in Gaithersburg, MD, Nov. 4-6, 1992. Evaluates new technologies in information retrieval. Numerous graphs, tables and charts.