National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000
Title | National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000 PDF eBook |
Author | |
Publisher | |
Pages | 160 |
Release | 2000 |
Genre | |
ISBN |
National Semiconductor Metrology Program
Title | National Semiconductor Metrology Program PDF eBook |
Author | National Institute of Standards and Technology (U.S.) |
Publisher | |
Pages | 160 |
Release | 2000 |
Genre | Semiconductors |
ISBN |
National Semiconductor Metrology Program
Title | National Semiconductor Metrology Program PDF eBook |
Author | National Semiconductor Metrology Program (U.S.) |
Publisher | |
Pages | 160 |
Release | 2000 |
Genre | Semiconductors |
ISBN |
National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999
Title | National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999 PDF eBook |
Author | |
Publisher | |
Pages | 148 |
Release | 1999 |
Genre | |
ISBN |
Monthly Catalog of United States Government Publications
Title | Monthly Catalog of United States Government Publications PDF eBook |
Author | |
Publisher | |
Pages | 1328 |
Release | 2003 |
Genre | Government publications |
ISBN |
Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results (rev. Ed. )
Title | Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results (rev. Ed. ) PDF eBook |
Author | Barry N. Taylor |
Publisher | DIANE Publishing |
Pages | 25 |
Release | 2009-11 |
Genre | Science |
ISBN | 1437915566 |
Results of measurements and conclusions derived from them constitute much of the technical information produced by the National Institute of Standards and Technology (NIST). In July 1992 the Director of NIST appointed an Ad Hoc Committee on Uncertainty Statements and charged it with recommending a policy on this important topic. The Committee concluded that the CIPM approach could be used to provide quantitative expression of measurement that would satisfy NIST¿s customers¿ requirements. NIST initially published a Technical Note on this issue in Jan. 1993. This 1994 edition addresses the most important questions raised by recipients concerning some of the points it addressed and some it did not. Illustrations.
First Text Retrieval Conference (TREC-1)
Title | First Text Retrieval Conference (TREC-1) PDF eBook |
Author | D. K. Harman |
Publisher | DIANE Publishing |
Pages | 527 |
Release | 1995-10 |
Genre | |
ISBN | 0788125214 |
Held in Gaithersburg, MD, Nov. 4-6, 1992. Evaluates new technologies in information retrieval. Numerous graphs, tables and charts.