Driven by interactions due to the charge, spin, orbital, and lattice degrees of freedom, nanoscale inhomogeneity has emerged as a new theme for materials with novel properties near multiphase boundaries. As vividly demonstrated in complex metal oxides and chalcogenides, these microscopic phases are of great scientific and technological importance for research in hightemperature superconductors, colossal magnetoresistance effect, phase-change memories, and domain switching operations. Direct imaging on dielectric properties of these local phases, however, presents a big challenge for existing scanning probe techniques. Here, we report the observation of electronic inhomogeneity in indium selenide (In2Se3) nanoribbons by near-field scanning microwave impedance microscopy. Multiple phases with local resistivity spanning six orders of magnitude are identified as the coexistence of superlattice, simple hexagonal lattice and amorphous structures with (almost equal to)100nm inhomogeneous length scale, consistent with high-resolution transmission electron microscope studies. The atomic-force-microscope-compatible microwave probe is able to perform quantitative sub-surface electronic study in a noninvasive manner. Finally, the phase change memory function in In2Se3 nanoribbon devices can be locally recorded with big signal of opposite signs.

Ability to measure local dielectric constant and conductivity at nanoscale is desir- able for many research disciplines. Traditional transport measurements and many scanning probe techniques require ohmic contacts to the sample, which further com- plicates the sample preparation and is a low throughput process. Techniques based on high-frequency coupling is advantageous over these techniques since the measure- ments rely on the capacitive coupling between the tip and the sample. Among the high-frequency probes, near-field microwave microscopy sits on the sweet spot with the advantages from the high frequency coupling, but still maintains high contrast between metal and insulator. Implementing microwave microscopy technique is no trivial task. The first part of this thesis describes various engineering aspects during the developmental stage of our microwave microscopy, which we call microwave impedance microscope (MIM). We will begin with introduction to the principle of near-field microscopy, and follow by describing various components of MIIM. The second part of the thesis devotes to the study of nanoscale electronic inhomogeneity both at room temperature and low temperature. The room temperature works provide examples of application of MIM for nanoscale electrical characterization in nano graphene and semiconductor devices. The low temperature studies focus on the phase transition in pervoskite manganites and edge states of two-dimensional electron gas. In pervoskite manganites, we provide direct observation of the phase-separation and the glassy behavior of manganites. In the two-dimensional systems, we study the formation edge states during quantum Hall and quantum spin Hall effects. Finally, we concludes the thesis with plans for future developments and scientific problems.

Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials—such as lithium-ion batteries, solar cells, and other energy-related materials—are addressed. FEATURES First book to focus on application of AFM for energy research Details the use of advanced AFM and addresses many types of functional AFM tools Enables readers to operate an AFM instrument successfully and to understand the data obtained Covers new achievements in AFM instruments, including electrochemical strain microscopy, and how AFM is being combined with other new methods such as infrared (IR) spectroscopy With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics who are working with AFM or planning to use it in their own fields of research, especially energy research.

The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.

This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.

Carbon Nanotubes and Graphene is a timely second edition of the original Science and Technology of Carbon Nanotubes. Updated to include expanded coverage of the preparation, purification, structural characterization, and common application areas of single- and multi-walled CNT structures, this work compares, contrasts, and, where appropriate, unitizes CNT to graphene. This much expanded second edition reference supports knowledge discovery, production of impactful carbon research, encourages transition between research fields, and aids the formation of emergent applications. New chapters encompass recent developments in the theoretical treatments of electronic and vibrational structures, and magnetic, optical, and electrical solid-state properties, providing a vital base to research. Current and potential applications of both materials, including the prospect for large-scale synthesis of graphene, biological structures, and flexible electronics, are also critically discussed. Updated discussion of properties, structure, and morphology of biological and flexible electronic applications aids fundamental knowledge discovery Innovative parallel focus on nanotubes and graphene enables you to learn from the successes and failures of, respectively, mature and emergent partner research disciplines High-quality figures and tables on physical and mathematical applications expertly summarize key information – essential if you need quick, critically relevant data

This series of books, which is published at the rate of about one per year, addresses fundamental problems in materials science. The contents cover a broad range of topics from small clusters of atoms to engineering materials and involve chemistry, physics, materials science, and engineering, with length scales ranging from Ångstroms up to millimeters. The emphasis is on basic science rather than on applications. Each book focuses on a single area of current interest and brings together leading experts to give an up-to-date discussion of their work and the work of others. Each article contains enough references that the interested reader can access the relevant literature. Thanks are given to the Center for Fundamental Materials Research at Michigan State University for supporting this series. M. F. Thorpe, Series Editor E-mail: thorpe@pa. msu. edu East Lansing, Michigan V PREFACE It is hard to believe that not quite ten years ago, namely in 1991, nanotubes of carbon were discovered by Sumio Iijima in deposits on the electrodes of the same carbon arc apparatus that was used to produce fullerenes such as the “buckyball”. Nanotubes of carbon or other materials, consisting ofhollow cylinders that are only a few nanometers in diameter, yet up to millimeters long, are amazing structures that self-assemble under extreme conditions. Their quasi-one-dimensional character and virtual absence of atomic defects give rise to a plethora of unusual phenomena.