This work offers a comprehensive source of information on metallographic techniques and their application to the study of metals, ceramics, and polymers. It contains an extensive collection of micro- and macrographs.

Treatise on Materials Science and Technology, Volume 11: Properties And Microstructure covers the parameters important to understanding microstructural effects. The book discusses the direct observation and characterization of defects in materials; the cause and effect of crystal defects in silicon integrated circuits; as well as the microstructure of some noncrystalline ceramics. The text also describes microstructural defects in the important semiconductors silicon and germanium, microstructural effects in glasses, microstructural effects on the mechanical properties of ceramics, and finally, microstructures in ferrites. Materials scientists, materials engineers, and graduate students taking related courses will find the book invaluable.

Treatise on Materials Science and Technology, Volume 4 covers the fundamental properties and characterization of materials, ranging from simple solids to complex heterophase systems. The book covers articles on advanced techniques by which thin films may be characterized; on diffusion in substitutional alloys; and on solid solution strengthening in face-centered cubic alloys. The text also includes articles on the thermodynamics of binary ordered intermetallic phases; and the major aspects of metal powder processing. Professional scientists and engineers, as well as graduate students in materials science and associated fields will find the book invaluable.

To use materials effectively, their composition, degree of perfection, physical and mechanical characteristics, and microstructure must be accurately determined. This concise encyclopledia covers the wide range of characterization techniques necessary to achieve this. Articles included are not only concerned with the characterization techniques of specific materials such as polymers, metals, ceramics and semiconductors but also techniques which can be applied to materials in general. The techniques described cover bulk methods, and also a number of specific methods to study the topography and composition of surface and near-surface regions. These techniques range from the well-established and traditional to the very latest including: atomic force microscopy; confocal optical microscopy; gamma ray diffractometry; thermal wave imaging; x-ray diffraction and time-resolved techniques. This unique concise encyclopedia comprises 116 articles by leading experts in the field from around the world to create the ideal guide for materials scientists, chemists and engineers involved with any aspect of materials characterization. With over 540 illustrations, extensive cross-referencing, approximately 900 references, and a detailed index, this concise encyclopedia will be a valuable asset to any materials science collection.