"The atomic force microscope (AFM) is a widely used instrument for imaging and direct manipulation of materials and particles at the nanoscale. The AFM uses a probe, which is a microcantilever with a sharp point at the end. Typically, the AFM is constructed with a single probe. The disadvantage of this construction is that it can only be used either for imaging or manipulation in one implementation. An AFM was constructed using two probes, permitting simultaneous imaging and manipulation. A dual-probe AFM (DP-AFM) provides a foundation for feedback controlled manipulation. Paper I investigates probe-on-probe contact stability and examines the dynamics of probe-on-probe contact. Evaluation of these interactions leads to study the stability of state-dependent switched systems. Uniform ultimate boundedness theorem and sequence nonincreasing condition corollary were employed to show stability of proposed state dependent switched model with DP-AFM application. Paper II is extending approach-retract curve to characterize probe-on-probe interaction. Universal sensitivity model for probe-on-probe interaction was found. During the retract phase, adhesion occurs between probes. Jump-off-contact deflection between probes was employed for adhesion force calculation. Paper III represents implementation of Iterative Learning Control on Z-axis nano-stage with stochastic and deterministic noise. The nano stage model was identified using frequency response of the stage. Deterministic and stochastic noise spectrum was identified experimentally. Optimal Q filter and learning filter (L-filter) were designed depending on the deterministic and stochastic noise spectrum. The error norm was experimentally found to be converging for all four ILC algorithms"--Abstract, page iv.

"Atomic force microscope (AFM) is one of the important and versatile tools available in the field of nanotechnology. It is a type of probe-based microscopy wherein an atomically sharp tip, mounted on the free end of a microcantilever, probes the surface of interest to generate 3D topographical images with nanoscale resolution. An integral part of the AFM is the feedback controller that regulates the probe deflection in the presence of surface height changes, enabling the control action to be used for generating topographical image of the sample. Besides sensing, the probe can also be used as a mechanical actuator to manipulate nanoparticles and fabricate nanoscale structures. Despite its capabilities, AFM is not considered user-friendly because imaging is slow, and fabrication operations are laborious and often performed in open-loop, i.e. without any monitoring mechanism. This dissertation is composed of two journal articles which aim to address prominent AFM challenges using feedback control strategies. First article proposes a novel control design methodology based on repetitive control technique to accurately track AFM samples. Theoretical and experimental results demonstrate that incorporating a model of the general sample topography in the control design leads to superior tracking in AFM. Second article introduces a novel dual-probe AFM (DP-AFM) design that has two independent probes. Such a setup provides an opportunity to implement process control strategies where one probe can be used to perform one of the many AFM operations while the other probe can provide feedback by imaging the process. To demonstrate this capability, an application involving real-time plowing depth control where plow depth is controlled with nanometer-level accuracy is also presented"--Abstract, page iv.

From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, system identification, signal processing, dynamic system modeling, controller. With a solid theoretical foundation, practical examples are provided for AFM subsystem level design on nano-positioning system, cantilever probe, control system and system integration. This book emphasizes novel development of active cantilever probes with embedded transducers, which enables new AFM capabilities for advanced applications. Full design details of a low-cost educational AFM and a Scale Model Interactive Learning Extended Reality (SMILER) toolkit are provided, which helps instructors to make use of this book for curriculum development. This book aims to empower AFM users with deeper understanding of the instrument to extend AFM functionalities for advanced state-of-the-art research studies. Going beyond AFM, materials presented in this book are widely applicable to precision mechatronic system design covered in many upper-level graduate courses in mechanical and electrical engineering to cultivate next generation instrumentalists.

This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy. The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD-ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs.

Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others. Scanning Probe Microscopy in Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments. The second half of the book describes applications of nanomechanical characterization in industry, including: New formulation development for pharmaceuticals Measurement of critical dimensions and thin dielectric films in the semiconductor industry Effect of humidity and temperature on biomaterials Characterization of polymer blends to guide product formulation in the chemicals sector Unraveling links between food structure and function in the food industry Contributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems. By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy in Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.

Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.