Despite the continued rapid advance in computing speed and memory the increase in the complexity of models used by engineers persists in outpacing them. Even where there is access to the latest hardware, simulations are often extremely computationally intensive and time-consuming when full-blown models are under consideration. The need to reduce the computational cost involved when dealing with high-order/many-degree-of-freedom models can be offset by adroit computation. In this light, model-reduction methods have become a major goal of simulation and modeling research. Model reduction can also ameliorate problems in the correlation of widely used finite-element analyses and test analysis models produced by excessive system complexity. Model Order Reduction Techniques explains and compares such methods focusing mainly on recent work in dynamic condensation techniques: - Compares the effectiveness of static, exact, dynamic, SEREP and iterative-dynamic condensation techniques in producing valid reduced-order models; - Shows how frequency shifting and the number of degrees of freedom affect the desirability and accuracy of using dynamic condensation; - Answers the challenges involved in dealing with undamped and non-classically damped models; - Requires little more than first-engineering-degree mathematics and highlights important points with instructive examples. Academics working in research on structural dynamics, MEMS, vibration, finite elements and other computational methods in mechanical, aerospace and structural engineering will find Model Order Reduction Techniques of great interest while it is also an excellent resource for researchers working on commercial finite-element-related software such as ANSYS and Nastran.

Closes the gap between hardcore-theoretical and purely experimental RF-MEMS books. The book covers, from a practical viewpoint, the most critical steps that have to be taken in order to develop novel RF-MEMS device concepts. Prototypical RF-MEMS devices, both including lumped components and complex networks, are presented at the beginning of the book as reference examples, and these are then discussed from different perspectives with regard to design, simulation, packaging, testing, and post-fabrication modeling. Theoretical concepts are introduced when necessary to complement the practical hints given for all RF-MEMS development stages. Provides researchers and engineers with invaluable practical hints on how to develop novel RF-MEMS device concepts Covers all critical steps, dealing with design, simulation, optimization, characterization and fabrication of MEMS for radio-frequency applications Addresses frequently disregarded issues, explicitly treating the hard to predict interplay between the three-dimensional device structure and its electromagnetic functionality Bridges theory and experiment, fundamental concepts are introduced with the application in mind, and simulation results are validated against experimental results Appeals to the practice-oriented R&D reader: design and simulation examples are based on widely known software packages such as ANSYS and the hardware description language Verilog.

System-level modeling of MEMS - microelectromechanical systems - comprises integrated approaches to simulate, understand, and optimize the performance of sensors, actuators, and microsystems, taking into account the intricacies of the interplay between mechanical and electrical properties, circuitry, packaging, and design considerations. Thereby, system-level modeling overcomes the limitations inherent to methods that focus only on one of these aspects and do not incorporate their mutual dependencies. The book addresses the two most important approaches of system-level modeling, namely physics-based modeling with lumped elements and mathematical modeling employing model order reduction methods, with an emphasis on combining single device models to entire systems. At a clearly understandable and sufficiently detailed level the readers are made familiar with the physical and mathematical underpinnings of MEMS modeling. This enables them to choose the adequate methods for the respective application needs. This work is an invaluable resource for all materials scientists, electrical engineers, scientists working in the semiconductor and/or sensor industry, physicists, and physical chemists.

The special volume offers a global guide to new concepts and approaches concerning the following topics: reduced basis methods, proper orthogonal decomposition, proper generalized decomposition, approximation theory related to model reduction, learning theory and compressed sensing, stochastic and high-dimensional problems, system-theoretic methods, nonlinear model reduction, reduction of coupled problems/multiphysics, optimization and optimal control, state estimation and control, reduced order models and domain decomposition methods, Krylov-subspace and interpolatory methods, and applications to real industrial and complex problems. The book represents the state of the art in the development of reduced order methods. It contains contributions from internationally respected experts, guaranteeing a wide range of expertise and topics. Further, it reflects an important effor t, carried out over the last 12 years, to build a growing research community in this field. Though not a textbook, some of the chapters can be used as reference materials or lecture notes for classes and tutorials (doctoral schools, master classes).

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