Metrology, Inspection, and Process Control for Microlithography
Title | Metrology, Inspection, and Process Control for Microlithography PDF eBook |
Author | |
Publisher | |
Pages | 914 |
Release | 2001 |
Genre | Measurement |
ISBN |
Metrology, Inspection, and Process Control for Microlithography XXX
Title | Metrology, Inspection, and Process Control for Microlithography XXX PDF eBook |
Author | Martha I. Sanchez |
Publisher | |
Pages | |
Release | 2016 |
Genre | |
ISBN |
Metrology, Inspection, and Process Control for Microlithography XVIII
Title | Metrology, Inspection, and Process Control for Microlithography XVIII PDF eBook |
Author | |
Publisher | |
Pages | 698 |
Release | 2004 |
Genre | Integrated circuits |
ISBN |
Metrology, Inspection, and Process Control for Microlithography XXX
Title | Metrology, Inspection, and Process Control for Microlithography XXX PDF eBook |
Author | Conference on Metrology, Inspection, and Process Control for Microlithography |
Publisher | |
Pages | 0 |
Release | 2016 |
Genre | |
ISBN |
Microlithography
Title | Microlithography PDF eBook |
Author | Bruce W. Smith |
Publisher | CRC Press |
Pages | 913 |
Release | 2020-05-01 |
Genre | Technology & Engineering |
ISBN | 1351643444 |
The completely revised Third Edition to the bestselling Microlithography: Science and Technology provides a balanced treatment of theoretical and operational considerations, from fundamental principles to advanced topics of nanoscale lithography. The book is divided into chapters covering all important aspects related to the imaging, materials, and processes that have been necessary to drive semiconductor lithography toward nanometer-scale generations. Renowned experts from the world’s leading academic and industrial organizations have provided in-depth coverage of the technologies involved in optical, deep-ultraviolet (DUV), immersion, multiple patterning, extreme ultraviolet (EUV), maskless, nanoimprint, and directed self-assembly lithography, together with comprehensive descriptions of the advanced materials and processes involved. New in the Third Edition In addition to the full revision of existing chapters, this new Third Edition features coverage of the technologies that have emerged over the past several years, including multiple patterning lithography, design for manufacturing, design process technology co-optimization, maskless lithography, and directed self-assembly. New advances in lithography modeling are covered as well as fully updated information detailing the new technologies, systems, materials, and processes for optical UV, DUV, immersion, and EUV lithography. The Third Edition of Microlithography: Science and Technology authoritatively covers the science and engineering involved in the latest generations of microlithography and looks ahead to the future systems and technologies that will bring the next generations to fruition. Loaded with illustrations, equations, tables, and time-saving references to the most current technology, this book is the most comprehensive and reliable source for anyone, from student to seasoned professional, looking to better understand the complex world of microlithography science and technology.
Metrology, Inspection, and Process Control for Microlithography XXX
Title | Metrology, Inspection, and Process Control for Microlithography XXX PDF eBook |
Author | Conference on Metrology, Inspection, and Process Control for Microlithography |
Publisher | |
Pages | 0 |
Release | 2016 |
Genre | Integrated circuits |
ISBN |
ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis
Title | ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis PDF eBook |
Author | ASM International |
Publisher | ASM International |
Pages | 540 |
Release | 2019-12-01 |
Genre | Technology & Engineering |
ISBN | 1627082735 |
The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.