Traditional techniques for detecting deception, such as the 'lie-detector test' (or polygraph), are based upon the idea that lying is associated with stress. However, it is possible that people telling the truth will experience stress, whereas not all liars will. Because of this, the validity of such methods is questionable. As an alternative, a knowledge-based approach known as the 'Concealed Information Test' has been developed which investigates whether the examinee recognizes secret information - for example a crime suspect recognizing critical crime details that only the culprit could know. The Concealed Information Test has been supported by decades of research, and is used widely in Japan. This is the first book to focus on this exciting approach and will be of interest to law enforcement agencies and academics and professionals in psychology, criminology, policing and law.

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Detecting Concealed Information and Deception: Recent Developments assembles contributions from the world's leading experts on all aspects of concealed information detection. This reference examines an array of different methods—behavioral, verbal interview and physiological—of detecting concealed information. Chapters from leading legal authorities address how to make use of detected information for present and future legal purposes. With a theoretical and empirical foundation, the book also covers new human interviewing techniques, including the highly influential Implicit Association Test among others. - Presents research from Concealed Information Test (CIT) studies - Explores the legal implications and admissibility of the CIT - Covers EEG, event-related brain potentials (ERP) and autonomic detection measures - Reviews multiple verbal lie detection tools - Discusses ocular movements during deception and evasion - Identifies how to perceive malicious intentions - Explores personality dimensions associated with deception, including religion, age and gender

Deception is a ubiquitous phenomenon in social interactions and has attracted a significant amount of research during the last decades. The majority of studies in this field focused on how deception modulates behavioral, autonomic, and brain responses and whether these changes can be used to validly identify lies. Especially the latter question, which historically gave rise to the development of psychophysiological “lie detection” techniques, has been driving research on deception and its detection until today. The detection of deception and concealed information in forensic examinations currently constitutes one of the most frequent applications of psychophysiological methods in the field. With the increasing use of such methods, the techniques for detecting deception have been controversially discussed in the scientific community. It has been proposed to shift from the original idea of detecting deception per se to a more indirect approach that allows for determining whether a suspect has specific knowledge of crime-related details. This so-called Concealed Information Test is strongly linked to basic psychological concepts concerning memory, attention, orienting, and response monitoring. Although research in this field has intensified with the advancement of neuroimaging techniques such as PET and fMRI in the last decade, basic questions on the psychological mechanisms underlying modulatory effects of deception and information concealment on behavioral, autonomic, and brain responses are still poorly understood. This Research Topic brings together contributions from researchers in experimental psychology, psychophysiology, and neuroscience focusing on the understanding of the broad concept of deception including the detection of concealed information, with respect to basic research questions as well as applied issues. This Research Topic is mainly composed of originalresearch articles but reviews and papers elaborating on novel methodological approaches have also been included. Experimental methods include, but are not limited to, behavioral, autonomic, electroencephalographic or brain imaging techniques that allow for revealing relevant facets of deception on a multimodal level. While this Research Topic primarily includes laboratory work, relevant issues for the field use of such methods are also discussed.

Handbook of Object Novelty Recognition, Volume 26, synthesizes the empirical and theoretical advances in the field of object recognition and memory that have occurred since the development of the spontaneous object recognition task. The book is divided into four sections, covering vision and perception of object features and attributions, definitions of concepts that are associated with object recognition, the influence of brain lesions and drugs on various memory functions and processes, and models of neuropsychiatric disorders based on spontaneous object recognition tasks. A final section covers genetic and developmental studies and gender and hormone studies. - Details the brain structures and the neural circuits that underlie memory of objects, including vision and olfaction - Provides a thorough description of the object novelty recognition task, variations on the basic task, and methods and techniques to help researchers avoid common pitfalls - Assists researchers in understanding all aspects of object memory, conducting object novelty recognition tests, and producing reliable, reproducible results

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Embedded memories are one of the fastest growing segments oftoday's new technology market. According to the 2001 InternationalTechnology Roadmap for Semiconductors, embedded memories will continueto dominate the increasing system on chip (SoC) content in the nextseveral years, approaching 94% of the SoC area in about 10 years.Furthermore, the shrinking size of manufacturing structures makesmemories more sensitive to defects. Consequently, the memory yieldwill have a dramatic impact on the overall Defect-per-million level, hence on the overall SoC yield. Meeting a high memory yield requiresunderstanding memory designs, modeling their faulty behaviors, designing adequate tests and diagnosis algorithms as well as efficientself-test and repair schemes."Testing Static Random Access Memories" covers testing of one ofthe important semiconductor memories types; it address testing ofstatic random access memories (SRAMs), both single-port andmulti-port. It contributes to the technical acknowledge needed bythose involved in memory testing, engineers and researchers. The bookbegins with outlining the most popular SRAMs architectures. Then, thedescription of realistic fault models, based on defect injection andSPICE simulation, are introduced. Thereafter, high quality and lowcost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with somepreliminary test results showing the importance of the new tests inreducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies isalso discussed.Features: