Material and contact characterisation is a rapidly advancing field that requires the application of a combination of numerical and experimental methods. Including papers from the International Conference on Computational Methods and Experiments in Material and Contact Characterisation this volume presents the latest research in the field.

This unique book is the Proceedings of the 8th International Symposium on the Characterisation of Porous Solids, known also as "COPS VIII". The conference is one of a series, held every three years, which covers developments in methods for the characterisation of porous materials, and applications of those methods. The scope of the conference: COPS VIII is concerned with fundamental and applied research on the characterisation of the structure of porous materials, and the relationship between structure and material performance. The scope includes experimental characterisation methods such as X-Ray diffraction, NMR, adsorption, mercury intrusion, and calorimetry; theoretical and simulation methods used to interpret experimental data, such as molecular simulation, classical and statistical mechanical theory, and pore network modelling; and applied research on the impact of measured material properties on performance in applications.

Until recently, engineering materials could be characterized successfully using relatively simple testing procedures. As materials technology advances, interest is growing in materials possessing complex meso-, micro- and nano-structures, which to a large extent determine their physical properties and behaviour. The purposes of materials modelling are many: optimization, investigation of failure, simulation of production processes, to name but a few. Modelling and characterisation are closely intertwined, increasingly so as the complexity of the material increases. Characterisation, in essence, is the connection between the abstract material model and the real-world behaviour of the material in question. Characterisation of complex materials therefore may require a combination of experimental techniques and computation. This book publishes papers presented at the Third International Conference on Computational Methods and Experiments in Material Characterisation.Topics covered include: Composites; Ceramics; Alloys; Cements and Cement Based Materials; Biomaterials; Thin Films and Coatings; Advanced Materials; Imaging Analysis; Thermal Analysis; New Methods; Surface Chemistry, Nano Indentation; Continuum Methods; Particle Models; Damage Mechanics; Innovative Techniques; Stochastic Methods.

This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.

This book explains why SiC is so useful in electronics, gives clear guidance on the various processing steps (growth, doping, etching, contact formation, dielectrics etc) and describes how these are integrated in device manufacture.

This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

This work presents the results of RILEM TC 237-SIB (Testing and characterization of sustainable innovative bituminous materials and systems). The papers have been selected for publication after a rigorous peer review process and will be an invaluable source to outline and clarify the main directions of present and future research and standardization for bituminous materials and pavements. The following topics are covered: - Characterization of binder-aggregate interaction - Innovative testing of bituminous binders, additives and modifiers - Durability and aging of asphalt pavements - Mixture design and compaction analysis - Environmentally sustainable materials and technologies - Advances in laboratory characterization of bituminous materials - Modeling of road materials and pavement performance prediction - Field measurement and in-situ characterization - Innovative materials for reinforcement and interlayer systems - Cracking and damage characterization of asphalt pavements - Recycling and re-use in road pavements This is the proceedings of the RILEM SIB2015 Symposium (Ancona, Italy, October 7-9, 2015).