Logging has come a long way from the simple electrical devices of the early years. Today's tools are considerably more accurate and are used for an increasingly diverse number of tasks. Among these are tools that characterise geological properties of rocks in the borehole. Combined with new technology to drill deviated wells, the geoscientist now has tools which allow him to characterise and develop reservoirs more accurately than ever. This book, written for researchers, graduate students and practising geoscientists, documents these techniques and illustrates their use in a number of typical case studies.

This book primarily focuses on the principles and applications of electric logging, sonic logging, nuclear logging, production logging and NMR logging, especially LWD tools, Sondex production logging tools and other advanced image logging techniques, such as ECLIPS 5700, EXCELL 2000 etc. that have been developed and used in the last two decades. Moreover, it examines the fundamentals of rock mechanics, which contribute to applications concerning the stability of borehole sidewall, safety density window of drilling fluid, fracturing etc. As such, the book offers a valuable resource for a wide range of readers, including students majoring in petrophysics, geophysics, geology and seismology, and engineers working in well logging and exploitation.

The first edition of this book demystified the process of well log analysis for students, researchers and practitioners. In the two decades since, the industry has changed enormously: technical staffs are smaller, and hydrocarbons are harder to locate, quantify, and produce. New drilling techniques have engendered new measurement devices incorporated into the drilling string. Corporate restructuring and the "graying" of the workforce have caused a scarcity in technical competence involved in the search and exploitation of petroleum. The updated 2nd Edition reviews logging measurement technology developed in the last twenty years, and expands the petrophysical applications of the measurements.