A laser hazard analysis and safety assessment was performed for each various laser diode candidates associated with the High Resolution Pulse Scanner based on the ANSI Standard Z136.1-2000, American National Standard for the Safe Use of Lasers. A theoretical laser hazard analysis model for this system was derived and an Excel{reg_sign} spreadsheet model was developed to answer the 'what if questions' associated with the various modes of operations for the various candidate diode lasers.

A laser hazard analysis and safety assessment was performed for the LASIRISTM Model MAG-501L-670M-1000-45o-K diode laser associated with the High Resolution Pulse Scanner based on the ANSI Standard Z136.1-2000, American National Standard for the Safe Use of Lasers and the ANSI Standard Z136.6-2000, American National Standard for the Safe Use of Lasers Outdoors. The laser was evaluated for both indoor and outdoor use.

Nearly a decade aga a general review article on the evaluation of optical radia tion hazards was published in Applied Optics (Sliney and Freasier, 1973). This arti cle received many favorable comments but also prompted many inquiries regarding specific optical hazard problems. From this it became evident that a monograph rather than a supplemental and expanded article was needed to fill this literature gap relating to laser and optical radiation hazards. The present work is designed to fill that gap, and is structured to permit either classroom or self-study use. Much of the material in this book was developed in eonnection with short courses on laser safety and radiometry in which we have participated, as weIl as from our previous articles. In particular, the sequenee of chapters is based upon the experiences which we have had in lecturing in courses with different schedules. One of the great difficulties in developing a text of this nature is that a broad, multidisciplinary background must be included in order that the reader can comprehend all of the subjeet matter readily. For this reason, the material presented on anatomy and physiology is orien ted toward the engineer or physical scientist, while the review material on basic optical physics is intended more for the physician or life scientist.

This is a practical guide to the safe use of lasers in science, education, industry, telecommunications, entertainment and medicine. Henderson explains the nature of laser hazards and how to implement safety controls to international standards.

This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.

This book is a printed edition of the Special Issue "MEMS Mirrors" that was published in Micromachines