Gives basic and up-to-date information about noise sources in electronic devices. Demonstrates how this information can be used to calculate the noise performance, in particular the noise figure, of electronic circuits using these devices. Optimization procedures, both for the circuits and for the devices, are then devised based on these data. Gives an elementary treatment of thermal noise, diffusion noise, and velocity-fluctuation noise, including quantum effects in thermal noise and maser noise.

Excerpt from Introduction to Noise in Solid State Devices This is a didactic monograph intended to be readable by physicists and electronic engineers with only general background, and should be of particular value to beginners of applied work in the field of noise. Others who wish to gain an understanding of this important phenomenon also will profit. The attempt has been made here to simplify a complex subject, and the text is mainly qualitative. An aim is to impart a feel for the subject, and while the treatment generally is not rigorous, it is not misleading. Although noise reduction as an ultimate goal is a main concern, the premise is that a basic under standing of noise processes forms a necessary base for the applications engineer or scientist as well as for the device designer. This monograph is divided into two parts. The first, Theory, deals in detail with each of the four principal noises found in solid state devices The emphasis here is on phenomenological aspects of noise, its origins, and its manifestations. The second part, Applications, is a systematic treatment of noise in selected solid state devices. Analyses progress from a single noise source in a circuit element to four noise sources in a device; concomitantly equivalent circuits are developed to facilitate the solution of various complex noise problems. The devices considered here were chosen as much for illustrative value as for commercial importance or currentness. They reveal the evolutionary nature of electron devices and the transfer of concepts from the earlier to the later devices, thus providing a simplifying coherence. Because of the way this work is structured, it should be read successively. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.

The replacement of thermionic devices by solid-state devices did not affect the fundamentals of thermal noise and shot noise but introduced a new range of applications and some new phenomena which is the subject of this book. Among the latter are generation-recombination noise, the still controversial 1/f noise, noise in avalanche devices and transferred-electron devices. Besides such semiconductor devices, also considered is noise in cryogenic devices, in charge-coupled devices, in ferromagnetic and ferroelectric materials and in radiation detectors.

Advances in Electronics and Electron Physics