Attenuated Total Reflection (ATR) Spectroscopy is now the most frequently used sampling technique for infrared spectroscopy. This book fully explains the theory and practice of this method. Offers introduction and history of ATR before discussing theoretical aspects Includes informative illustrations and theoretical calculations Discusses many advanced aspects of ATR, such as depth profiling or orientation studies, and particular features of reflectance

Presents coverage of internal reflection spectroscopy (IRS) and its applications to polymer, semiconductor, biological, electrochemical and membrane research. It describes the theory and procedures and identifies the spectral regions, from materials characterization to process monitoring.

Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which eliminated the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, "Materials Character ization," to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.

Practical Sampling Techniques for Infrared Analysis provides a single-source guide to sample handling for routine analysis in infrared spectroscopy using commercially available instrumentation and accessories. Following a review of infrared spectroscopic theory, chapters consider individual techniques such as transmission methodology (e.g., solution cells, KBr pellets), internal reflectance, diffuse reflectance, photoacoustic FT-IR, infrared microscopy, GC/FT-IR, and quantitative analysis. In addition, two chapters elaborate on both typical and unusual samples and problems encountered in industrial laboratories and the process by which a spectroscopist chooses the most effective technique. Various short courses on infrared analysis are also listed. Practical Sampling Techniques for Infrared Analysis will be an important guide for all professional analytical chemists and technicians.

This updated edition describes both the mathematical theory behind a modern photorealistic rendering system as well as its practical implementation. Through the ideas and software in this book, designers will learn to design and employ a full-featured rendering system for creating stunning imagery. Includes a companion site complete with source code for the rendering system described in the book, with support for Windows, OS X, and Linux.

Reflectance spectroscopy is the investigation of the spectral composi tion of surface-reflected radiation with respect to its angularly dependent intensity and the composition of the incident primary radiation. Two limiting cases are important: The first concerns regular (specular) reflection from a smooth surface, and the second diffuse reflection from an ideal matte surface. All possible variations are found in practice between these two extremes. For the two extreme cases, two fundamentally different methods of reflectance spectroscopy are employed: The first of these consists in evaluating the optical constants n (refractive index) and x (absorption index) from the measured regular reflection by means of the Fresnel equations as a function of the wave A. This rather old and very troublesome procedure, which is length incapable of very accurate results, has recently been modified by Fahren fort by replacing the air-sample phase boundary by the phase boundary between a dielectric of higher refractive index (n ) and the sample (n ). 1 2 If the sample absorbs no radiation and the angle of incidence exceeds a certain definite value, total reflection occurs. On close optical contact between the two phases, a small amount of energy is transferred into the less dense phase because of diffraction phenomena at the edges of the incident beam. The energy flux in the two directions through the phase boundary caused by this is equal, however, so that 'total reflection takes place.