Integrated Circuit Metrology, Inspection, and Process Control III

Integrated Circuit Metrology, Inspection, and Process Control III
Title Integrated Circuit Metrology, Inspection, and Process Control III PDF eBook
Author Kevin M. Monahan
Publisher
Pages 556
Release 1989
Genre Technology & Engineering
ISBN

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Integrated Circuit Metrology, Inspection, and Process Control

Integrated Circuit Metrology, Inspection, and Process Control
Title Integrated Circuit Metrology, Inspection, and Process Control PDF eBook
Author
Publisher
Pages 576
Release 1994
Genre Electronic circuit design
ISBN

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Integrated Circuit Metrology, Inspection, and Process Control II

Integrated Circuit Metrology, Inspection, and Process Control II
Title Integrated Circuit Metrology, Inspection, and Process Control II PDF eBook
Author Kevin M. Monahan
Publisher
Pages 476
Release 1988
Genre Mathematics
ISBN

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Semiconductor Measurement Technology

Semiconductor Measurement Technology
Title Semiconductor Measurement Technology PDF eBook
Author National Institute of Standards and Technology (U.S.)
Publisher
Pages 140
Release 1990
Genre Semiconductors
ISBN

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Integrated Circuit Metrology, Inspection, and Process Control

Integrated Circuit Metrology, Inspection, and Process Control
Title Integrated Circuit Metrology, Inspection, and Process Control PDF eBook
Author Kevin M. Monahan
Publisher
Pages 340
Release 1987
Genre Technology & Engineering
ISBN

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Microlithography

Microlithography
Title Microlithography PDF eBook
Author Bruce W. Smith
Publisher CRC Press
Pages 913
Release 2020-05-01
Genre Technology & Engineering
ISBN 1351643444

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The completely revised Third Edition to the bestselling Microlithography: Science and Technology provides a balanced treatment of theoretical and operational considerations, from fundamental principles to advanced topics of nanoscale lithography. The book is divided into chapters covering all important aspects related to the imaging, materials, and processes that have been necessary to drive semiconductor lithography toward nanometer-scale generations. Renowned experts from the world’s leading academic and industrial organizations have provided in-depth coverage of the technologies involved in optical, deep-ultraviolet (DUV), immersion, multiple patterning, extreme ultraviolet (EUV), maskless, nanoimprint, and directed self-assembly lithography, together with comprehensive descriptions of the advanced materials and processes involved. New in the Third Edition In addition to the full revision of existing chapters, this new Third Edition features coverage of the technologies that have emerged over the past several years, including multiple patterning lithography, design for manufacturing, design process technology co-optimization, maskless lithography, and directed self-assembly. New advances in lithography modeling are covered as well as fully updated information detailing the new technologies, systems, materials, and processes for optical UV, DUV, immersion, and EUV lithography. The Third Edition of Microlithography: Science and Technology authoritatively covers the science and engineering involved in the latest generations of microlithography and looks ahead to the future systems and technologies that will bring the next generations to fruition. Loaded with illustrations, equations, tables, and time-saving references to the most current technology, this book is the most comprehensive and reliable source for anyone, from student to seasoned professional, looking to better understand the complex world of microlithography science and technology.

Semiconductor Measurement Technology

Semiconductor Measurement Technology
Title Semiconductor Measurement Technology PDF eBook
Author United States. National Bureau of Standards
Publisher
Pages 116
Release 1988
Genre Integrated circuits
ISBN

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