Highly accurate chemical speciation is of great importance in environmental, clinical, and food sciences, as well as in archaeometry. Trace analysis via atomic spectrometry, mass spectroscopy, gas chromatography, electron microprobing, or X-ray absorption spectroscopy provides detailed information on surface and sub-surface domain of samples. The book comprehensively presents modern techniques, timely application, and data modeling.

"Organic Trace Analysis" presents the basics of trace analysis, from sample preparation to the measurement: Students are introduced to statistical evaluation, quality control technologies, sampling and preparation of organic traces, as well as to enrichment and separation of samples. Spectroscopic techniques as chromatography, capillary electrophoresis, mass spectrometry, and receptor-based bioanalysis are presented in detail.

This handbook is unique in its comprehensive coverage of the subject and focus on practical applications in diverse fields. It includes methods for sample preparation, the role of certified reference materials, calibration methods and statistical evaluation of the results. Problems concerning inorganic and bioinorganic speciation analysis, as well as special aspects such as trace analysis of noble metals, radionuclides and volatile organic compounds are also discussed. A significant part of the content presents applications of methods and procedures in medicine (metabolomics and therapeutic drug monitoring); pharmacy (the analysis of contaminants in drugs); studies of environmental samples; food samples and forensic analytics – essential examples that will also facilitate problem solving in related areas.

Trace Analysis is a highly practical book which deals with the science rather than the paperwork of quality assurance systems. Produced as part of the UK Valid Analytical Measurement (VAM) initiative, it provides the analyst with a systematic approach across the broad spectrum of trace analysis, offering practical advice and guidance on methodology and techniques. The book is structured to take the analyst step-by-step through the stages of any trace analysis. The approach is general, being broken down only into types of analyte. Additional chapters explain the application of groups of techniques to each analyte type. Each section contains references to published material which will allow the analyst to obtain further information on specific topics. Throughout the book, the analyst is reminded of pitfalls which lead to unreliable results. This new book therefore offers invaluable advice to analysts in all areas and at all levels, providing practical 'expert' advice on methodology. It will prove indispensable as a single, comprehensive bench guide for analysts in university, college and industrial laboratories.

Following the collection of a sample, every analytical chemist will agree that its subsequent preservation and processing are of paramount importance. The availability of high performance analytical instrumentation has not diminished this need for careful selection of appropriate pretreatment methodologies, intelligently designed to synergistically elicit optimum function from these powerful measurement tools. Sample Preparation for Trace Element Analysis is a modern, comprehensive treatise, providing an account of the state-of-the art on the subject matter. The book has been conceived and designed to satisfy the varied needs of the practicing analytical chemist. It is a multi-author work, reflecting the diverse expertise arising from its highly qualified contributors. The first five chapters deal with general issues related to the determination of trace metals in varied matrices, such as sampling, contamination control, reference materials, calibration and detection techniques. The second part of the book deals with extraction and sampling technologies (totaling 15 chapters), providing theoretical and practical hints for the users on how to perform specific extractions. Subsequent chapters overview seven major representative matrices and the sample preparation involved in their characterization. This portion of the book is heavily based on the preceding chapters dealing with extraction technologies. The last ten chapters are dedicated to sample preparation for trace element speciation.- First title to provide comprehensive sample preparation information, dealing specifically with the analysis of samples for trace elements. - The 39 chapters are authored by international leaders of their fields.

Trace Analysis, Volume 4 presents critical discussions of selected topics in organic and inorganic analytical chemistry including instrumentation, techniques, and applications to the detection, identification, and quantitation of trace quantities of substances in a large variety of sample materials. The volume is directed towards topics in the trace analysis of biological materials and environmental samples. Chapters are devoted to discussions on developments and applications of ion-selective polymeric membrane electrodes for biological tissues and fluids; evaluation of X-ray emission spectroscopy for trace analysis; the use of solid adsorbents for pre-concentrating trace organic substances, mainly pollutants, from air; and comparison of neutron activation analysis and proton-induced X-ray emission spectroscopy for the determination of trace elements in rain and snow. Organic and inorganic chemists, medical technicians, and ecologists will find the book a good reference material.

Trace Analysis of Semiconductor Materials is a guidebook concerned with procedures of ultra-trace analysis. This book discusses six distinct techniques of trace analysis. These techniques are the most common and can be applied to various problems compared to other methods. Each of the four chapters basically includes an introduction to the principles and general statements. The theoretical basis for the technique involved is then briefly discussed. Practical applications of the techniques and the different instrumentations are explained. Then, the applications to trace analysis as pertaining to semiconductor materials are discussed. Chapter 1 discusses radiochemical practice, the analysis of semiconductor materials, separation techniques, several qualitative radiochemical schemes, radiochemical purification procedures, and several earlier reported studies. Chapter 2 covers emission spectroscopy, including its potential for future applications. Discussions in Chapter 3 explain the benefits of each of the four mass spectrometric methods, namely, the isotope dilution method, complete thermal vaporization, vacuum spark technique, and the ion bombardment method. Chapter 4 focuses on the absorption, fluorescence, and polarographic methods used in general trace analysis, including examples of semiconductor material applications and other problems that result when certain impurities are introduced into the test sample. This monograph will be useful for researchers in ultra-trace analysis, nuclear physics, and analytical chemistry.