ICCAD serves EDA and design professionals, highlighting new challenges and innovative solutions for integrated circuit design technology and systems

ICCAD has been a premier forum which has paved the way in creating systems which are fast, small, power efficient, low cost, correct, manufacturable, and reliable

This book provides readers with an up-to-date account of the use of machine learning frameworks, methodologies, algorithms and techniques in the context of computer-aided design (CAD) for very-large-scale integrated circuits (VLSI). Coverage includes the various machine learning methods used in lithography, physical design, yield prediction, post-silicon performance analysis, reliability and failure analysis, power and thermal analysis, analog design, logic synthesis, verification, and neuromorphic design. Provides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon validation, and reliability; Discusses the use of machine learning techniques in the context of analog and digital synthesis; Demonstrates how to formulate VLSI CAD objectives as machine learning problems and provides a comprehensive treatment of their efficient solutions; Discusses the tradeoff between the cost of collecting data and prediction accuracy and provides a methodology for using prior data to reduce cost of data collection in the design, testing and validation of both analog and digital VLSI designs. From the Foreword As the semiconductor industry embraces the rising swell of cognitive systems and edge intelligence, this book could serve as a harbinger and example of the osmosis that will exist between our cognitive structures and methods, on the one hand, and the hardware architectures and technologies that will support them, on the other....As we transition from the computing era to the cognitive one, it behooves us to remember the success story of VLSI CAD and to earnestly seek the help of the invisible hand so that our future cognitive systems are used to design more powerful cognitive systems. This book is very much aligned with this on-going transition from computing to cognition, and it is with deep pleasure that I recommend it to all those who are actively engaged in this exciting transformation. Dr. Ruchir Puri, IBM Fellow, IBM Watson CTO & Chief Architect, IBM T. J. Watson Research Center

Research and development of logic synthesis and verification have matured considerably over the past two decades. Many commercial products are available, and they have been critical in harnessing advances in fabrication technology to produce today's plethora of electronic components. While this maturity is assuring, the advances in fabrication continue to seemingly present unwieldy challenges. Logic Synthesis and Verification provides a state-of-the-art view of logic synthesis and verification. It consists of fifteen chapters, each focusing on a distinct aspect. Each chapter presents key developments, outlines future challenges, and lists essential references. Two unique features of this book are technical strength and comprehensiveness. The book chapters are written by twenty-eight recognized leaders in the field and reviewed by equally qualified experts. The topics collectively span the field. Logic Synthesis and Verification fills a current gap in the existing CAD literature. Each chapter contains essential information to study a topic at a great depth, and to understand further developments in the field. The book is intended for seniors, graduate students, researchers, and developers of related Computer-Aided Design (CAD) tools. From the foreword: "The commercial success of logic synthesis and verification is due in large part to the ideas of many of the authors of this book. Their innovative work contributed to design automation tools that permanently changed the course of electronic design." by Aart J. de Geus, Chairman and CEO, Synopsys, Inc.

CMOS manufacturing environments are surrounded with symptoms that can indicate serious test, design, or reliability problems, which, in turn, can affect the financial as well as the engineering bottom line. This book educates readers, including non-engineers involved in CMOS manufacture, to identify and remedy these causes. This book instills the electronic knowledge that affects not just design but other important areas of manufacturing such as test, reliability, failure analysis, yield-quality issues, and problems. Designed specifically for the many non-electronic engineers employed in the semiconductor industry who need to reliably manufacture chips at a high rate in large quantities, this is a practical guide to how CMOS electronics work, how failures occur, and how to diagnose and avoid them. Key features: Builds a grasp of the basic electronics of CMOS integrated circuits and then leads the reader further to understand the mechanisms of failure. Unique descriptions of circuit failure mechanisms, some found previously only in research papers and others new to this publication. Targeted to the CMOS industry (or students headed there) and not a generic introduction to the broader field of electronics. Examples, exercises, and problems are provided to support the self-instruction of the reader.

This excellent survey of state-of-the-art techniques discusses the MTCMOS technology that has emerged as an increasingly popular technique to control the escalating leakage power, while maintaining high performance. It addresses the leakage problem in a number of designs for combinational, sequential, dynamic and current-steering logic.

This book highlights both the key achievements of electronic systems design targeting SoC implementation style, and the future challenges presented by the continuing scaling of CMOS technology.