A description of both the theory and practice of physical measurements that use high-sensitivity moiré - principally moiré interferometry. The focus here is on the mechanics and micromechanics of materials and structural elements and the book includes new studies published for the first time. Diverse fields are addressed: advanced composite materials, thermal stresses, electronic packaging, fracture, metallurgy, time-dependence, strain gage calibration. All the methods can be applied for whole-field measurements on nearly and solid bodies. This reader-friendly book will serve engineers and scientists who are concerned with measurements of real phenomena, while also stimulating students to pursue the treasures of experimental analysis.

Fourteen peer-reviewed papers on testing techniques, analysis approaches, and descriptions of various failure processes. From the Symposium on [title] held at Sparks, NV, April 1988. Annotation copyright Book News, Inc. Portland, Or.

A comprehensive review of the field of materials that shield people and sensitive electronic devices from electromagnetic fields Advanced Materials for Electromagnetic Shielding offers a thorough review of the most recent advances in the processing and characterization of the electromagnetic shielding materials. In this groundbreaking book, the authors—noted experts in the field—discuss the fundamentals of shielding theory as well as the practice of electromagnetic field measuring techniques and systems. They also explore applications of shielding materials used as absorbers of electromagnetic radiation, or as magnetic shields and explore coverage of new advanced materials for EMI shielding in aerospace applications. In addition, the text contains methods of preparation and applicability of metal foams. This comprehensive text examines the influence of technology on the micro-and macrostructure of polymers enabling their use in screening technology, technologies of shielding materials based on textiles, and analyses of its effectiveness in screening. The book also details the method of producing nanowires and their applications in EM shielding. This important resource: Explores the burgeoning market of electromagnetic shielding materials as we create, depend upon, and are exposed to more electronic devices than ever Addresses the most comprehensive issues relating to electromagnetic fields Contains information on the manufacturing, characterization methods, and properties of materials used to protect against them Discusses the important characterization techniques compared with one another, thus allowing scientists to select the best approach to a problem Written for materials scientists, electrical and electronics engineers, physicists, and industrial researchers, Advanced Materials for Electromagnetic Shielding explores all aspects in the area of electromagnetic shielding materials and examines the current state-of-the-art and new challenges in this rapidly growing area.

Since its development in the late 1970s, the Moire Fringe method has become a standard technique for the measurement of the behavior of materials and structures. Edited by one of the co-inventors of the technique, the Handbook of Moire Measurement brings together a series of extended case studies from recognized experts in the field. The emphasis i

Where conventional testing and inspection techniques fail at the microscale, optical techniques provide a fast, robust, noninvasive, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems, Second Edition, extends and updates the first comprehensive survey of the most important optical measurement techniques to be successfully used for the inspection of microsystems. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image processing, image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moire techniques, interference microscopy, laser-Doppler vibrometry, digital holography, speckle metrology, spectroscopy, and sensor fusion technologies. They also examine modern approaches to data acquisition and processing, such as the determination of surface features and the estimation of uncertainty of measurement results. The book emphasizes the evaluation of various system properties and considers encapsulated components to increase quality and reliability. Numerous practical examples and illustrations of optical testing reinforce the concepts. Supplying effective tools for increased quality and reliability, this book Provides a comprehensive, up-to-date overview of optical techniques for the measurement and inspection of microsystems Discusses image correlation, displacement and strain measurement, electro-optic holography, and speckle metrology techniques Offers numerous practical examples and illustrations Includes calibration of optical measurement systems for the inspection of MEMS Presents the characterization of dynamics of MEMS