This book is a step-by-step tutorial on how to design a low-power, high-resolution (not less than 12 bit), and high-speed (not less than 200 MSps) integrated CMOS analog-to-digital (AD) converter, to respond to the challenge from the rapid growth of IoT. The discussion includes design techniques on both the system level and the circuit block level. In the architecture level, the power-efficient pipelined AD converter, the hybrid AD converter and the time-interleaved AD converter are described. In the circuit block level, the reference voltage buffer, the opamp, the comparator, and the calibration are presented. Readers designing low-power and high-performance AD converters won’t want to miss this invaluable reference. Provides an in-depth introduction to the newest design techniques for the power-efficient, high-resolution (not less than 12 bit), and high-speed (not less than 200 MSps) AD converter; Presents three types of power-efficient architectures of the high-resolution and high-speed AD converter; Discusses the relevant circuit blocks (i.e., the reference voltage buffer, the opamp, and the comparator) in two aspects, relaxing the requirements and improving the performance.

One of the main trends of microelectronics is toward design for integrated systems, i.e., system-on-a-chip (SoC) or system-on-silicon (SoS). Due to this development, design techniques for mixed-signal circuits become more important than before. Among other devices, analog-to-digital and digital-to-analog converters are the two bridges between the analog and the digital worlds. Besides, low-power design technique is one of the main issues for embedded systems, especially for hand-held applications. Modular Low-Power, High-Speed CMOS Analog-to-Digital Converter for Embedded Systems aims at design techniques for low-power, high-speed analog-to-digital converter processed by the standard CMOS technology. Additionally this book covers physical integration issues of A/D converter integrated in SoC, i.e., substrate crosstalk and reference voltage network design.

Winner, 2013 PROSE Award, Engineering and Technology Concise, high quality and comparative overview of state-of-the-art electron device development, manufacturing technologies and applications Guide to State-of-the-Art Electron Devices marks the 60th anniversary of the IRE electron devices committee and the 35th anniversary of the IEEE Electron Devices Society, as such it defines the state-of-the-art of electron devices, as well as future directions across the entire field. Spans full range of electron device types such as photovoltaic devices, semiconductor manufacturing and VLSI technology and circuits, covered by IEEE Electron and Devices Society Contributed by internationally respected members of the electron devices community A timely desk reference with fully-integrated colour and a unique lay-out with sidebars to highlight the key terms Discusses the historical developments and speculates on future trends to give a more rounded picture of the topics covered A valuable resource R&D managers; engineers in the semiconductor industry; applied scientists; circuit designers; Masters students in power electronics; and members of the IEEE Electron Device Society.

High-speed, power-efficient analog integrated circuits can be used as standalone devices or to interface modern digital signal processors and micro-controllers in various applications, including multimedia, communication, instrumentation, and control systems. New architectures and low device geometry of complementary metaloxidesemiconductor (CMOS) technologies have accelerated the movement toward system on a chip design, which merges analog circuits with digital, and radio-frequency components.

CMOS Telecom Data Converters compiles the latest achievements regarding the design of high-speed and high-resolution data converters in deep submicron CMOS technologies. The four types of analog-to-digital converter architectures commonly found in this arena are covered, namely sigma-delta, pipeline, folding/interpolating and flash. For all these types, latest achievements regarding the solution of critical architectural and circuital issues are presented, and illustrated through IC prototypes with measured state-of-the-art performances. Some of these prototypes are conceived to be employed at the chipset of newest generation wireline modems (ADSL and ADSL+). Others are intended for wireless transceivers. Besides analog-to-digital converters, the book also covers other functions needed for communication systems, such as digital-to-analog converters, analog filters, programmable gain amplifiers, digital filters, and line drivers.

This book describes techniques for realizing wide bandwidth (125MHz) over-sampled analog-to-digital converters (ADCs) in nano meter-CMOS processes. The authors offer a clear and complete picture of system level challenges and practical design solutions in high-speed Delta-Sigma modulators. Readers will be enabled to implement ADCs as continuous-time delta-sigma (CT∆Σ) modulators, offering simple resistive inputs, which do not require the use of power-hungry input buffers, as well as offering inherent anti-aliasing, which simplifies system integration. The authors focus on the design of high speed and wide-bandwidth ΔΣMs that make a step in bandwidth range which was previously only possible with Nyquist converters. More specifically, this book describes the stability, power efficiency and linearity limits of ΔΣMs, aiming at a GHz sampling frequency.

With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circuit feature sizes are increasing. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. The inherent randomness of materials used in fabrication at nanoscopic scales means that performance will be increasingly variable, not only from die-to-die but also within each individual die. Parametric variability will be compounded by degradation in nanoscale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. In an attempt to address these issues, Low-Power High-Resolution Analog-to-Digital Converters specifically focus on: i) improving the power efficiency for the high-speed, and low spurious spectral A/D conversion performance by exploring the potential of low-voltage analog design and calibration techniques, respectively, and ii) development of circuit techniques and algorithms to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover errors continuously. The feasibility of the described methods has been verified by measurements from the silicon prototypes fabricated in standard 180nm, 90nm and 65nm CMOS technology.