Gettering and Defect Engineering in Semiconductor Technology VI
Title | Gettering and Defect Engineering in Semiconductor Technology VI PDF eBook |
Author | Hans Richter |
Publisher | Trans Tech Publications Ltd |
Pages | 640 |
Release | 1995-07-13 |
Genre | Technology & Engineering |
ISBN | 3035706611 |
At the present time, Si-based technology is undergoing a transition to the next generation of substrates, having a diameter of 300 mm. The fundamental physical limits are being approached in terms of miniaturization, increased chip area, faster switching speeds, and diversity of operations. This raises the question of the intrinsic limits of the currently predominant semiconductor, silicon, and of those circumstances where it may be advantageous to turn to materials such as GaAs, InP, or SiC.
Gettering and Defect Engineering in Semiconductor Technology VI
Title | Gettering and Defect Engineering in Semiconductor Technology VI PDF eBook |
Author | |
Publisher | |
Pages | 640 |
Release | 1995 |
Genre | |
ISBN |
At the present time, Si-based technology is undergoing a transition to the next generation of substrates, having a diameter of 300 mm. The fundamental physical limits are being approached in terms of miniaturization, increased chip area, faster switching speeds, and diversity of operations. This raises the question of the intrinsic limits of the currently predominant semiconductor, silicon, and of those circumstances where it may be advantageous to turn to materials such as GaAs, InP, or SiC. Progress in the field of semiconductor materials science is closely connected to the development of new or improved characterization techniques. These are tending towards atomic dimensions on the one hand and to the possibility of characterizing semiconductor wafers of increased diameter on the other hand. This timely publication comprises 20 invited and 54 contributed papers from more than 70 research institutes and universities in 23 countries, and offers a useful overview of the subject.
Gettering and Defect Engineering in Semiconductor Technology XVI
Title | Gettering and Defect Engineering in Semiconductor Technology XVI PDF eBook |
Author | Peter Pichler |
Publisher | Trans Tech Publications Ltd |
Pages | 500 |
Release | 2015-10-23 |
Genre | Technology & Engineering |
ISBN | 3035700834 |
Collection of selected, peer reviewed papers from the GADEST 2015: Gettering and Defect Engineering in Semiconductor Technology, September 20-25, 2015, Bad Staffelstein, Germany. The 7 1 papers are grouped as follows: Chapter 1: Growth of Mono- and Multi-Crystalline Silicon; Chapter 2: Passivation and Defect Studies in Solar Cells; Chapter 3: Intrinsic Point Defects and Dislocations in Silicon; Chapter 4: Light Elements in Silicon-Based Materials; Chapter 5: Properties and Gettering of Transition Metals in Silicon; Chapter 6: Radiation- and Impurity-Related Defect Studies in Silicon and Germanium; Chapter 7: Thermal Properties of Semiconductors; Chapter 8: Luminescence and Optical Properties of Semiconductors; Chapter 9: Nano-Sized Layers and Structures; Chapter 10: Wide-Bandgap Semiconductors; Chapter 11: Advanced Methods and Tools for Investigation of Semiconductor Materials
Gettering and Defect Engineering in Semiconductor Technology XV
Title | Gettering and Defect Engineering in Semiconductor Technology XV PDF eBook |
Author | J.D. Murphy |
Publisher | Trans Tech Publications Ltd |
Pages | 520 |
Release | 2013-10-07 |
Genre | Technology & Engineering |
ISBN | 3038262056 |
The book includes both fundamental and technological aspects of defects in semiconductor materials and devices, including photovoltaics. Volume is indexed by Thomson Reuters CPCI-S (WoS). The 74 papers are grouped as follows: I. Defect engineering in silicon solar cells; II. Structural and production issues in cast silicon materials for solar cells; III. Characterisation of silicon for solar cells; IV. Intrinsic point defects in silicon; V. Light impurities in silicon-based materials; VI. Metals in silicon: fundamental properties and gettering; VII. Extended and implantation-related defects in silicon; VIII. Surfaces, passivation and processing; IX. Germanium-based devices and materials; X. Semiconductors other than silicon and germanium; XI. Nanostructures and new materials systems.
Gettering and Defect Engineering in Semiconductor Technology XI
Title | Gettering and Defect Engineering in Semiconductor Technology XI PDF eBook |
Author | Bernard Pichaud |
Publisher | Trans Tech Publications Ltd |
Pages | 830 |
Release | 2005-12-15 |
Genre | Technology & Engineering |
ISBN | 303813029X |
Volume is indexed by Thomson Reuters CPCI-S (WoS). This proceedings volume contains 126 contributions from the 11th international meeting on Gettering and Defect Engineering in Semiconductor Technology GADEST 2005 held at La Badine at the Giens peninsula south of France.
Gettering and Defect Engineering in Semiconductor Technology X
Title | Gettering and Defect Engineering in Semiconductor Technology X PDF eBook |
Author | Hans Richter |
Publisher | Trans Tech Publications Ltd |
Pages | 704 |
Release | 2003-09-30 |
Genre | Technology & Engineering |
ISBN | 3035707243 |
Volume is indexed by Thomson Reuters CPCI-S (WoS). This volume is a collection of papers presented at the 10th International Autumn Meeting on "Gettering and Defect Engineering in Semiconductor Technology - GADEST 2003," which took place from the 21st to the 26th of September 2003 at the Seehotel Zeuthen, in the state of Brandenburg, Germany. The Seehotel Zeuthen, near Berlin, was an excellent location at which to provide a forum for interactions between scientists and engineers engaged in the field of semiconductor defect physics, materials science and technology; and to reflect upon aspects of the coming era of conversion from micro-electronics to nano-electronics. In addition, a particular ambition was to strengthen the interactions and exchanges between communities working in the fields of crystalline silicon for electronics and photovoltaics.
Gettering and Defect Engineering in Semiconductor Technology XIV
Title | Gettering and Defect Engineering in Semiconductor Technology XIV PDF eBook |
Author | W. Jantsch |
Publisher | Trans Tech Publications Ltd |
Pages | 516 |
Release | 2011-08-16 |
Genre | Technology & Engineering |
ISBN | 3038135151 |
Volume is indexed by Thomson Reuters CPCI-S (WoS). The papers contained herein cover the most important and timely issues in the field of Gettering and Defect Engineering in Semiconductor Technology, ranging from the theoretical analysis of defect problems to practical engineering solutions, with the emphasis on Si-based materials. Apart from the traditional topics of defect and materials engineering, characterization, modeling and simulation, and the co-integration of various material classes, topics such as materials for solar cells and photonics are discussed. Defects in graphene and in nanocrystals and nanowires are also treated, making this a very up-to-date survey of the field.