This Springer Handbook of Metrology and Testing presents the principles of Metrology – the science of measurement – and the methods and techniques of Testing – determining the characteristics of a given product – as they apply to chemical and microstructural analysis, and to the measurement and testing of materials properties and performance, including modelling and simulation. The principal motivation for this Handbook stems from the increasing demands of technology for measurement results that can be used globally. Measurements within a local laboratory or manufacturing facility must be able to be reproduced accurately anywhere in the world. The book integrates knowledge from basic sciences and engineering disciplines, compiled by experts from internationally known metrology and testing institutions, and academe, as well as from industry, and conformity-assessment and accreditation bodies. The Commission of the European Union has expressed this as there is no science without measurements, no quality without testing, and no global markets without standards.

The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.

Geometrical Dimensioning and Tolerancing for Design, Manufacturing and Inspection: A Handbook for Geometrical Product Specification Using ISO and ASME Standards, Third Edition presents the state-of-the art in geometrical dimensioning and tolerancing. The book describes the international standardization in this field while also indicating how it differs from the American Standard ASME Y14.5M. The general principles of geometric dimensioning and tolerancing are described, helping users define precision-related specifications unambiguously and consistently with the constraints of the manufacturing and inspection processes. Principles for the inspection of geometrical deviations are given, along with a basis for tolerancing suitable for inspection. Since publication of the second edition of this book in 2006 more than ten ISO GPS standards have been revised, involving the introduction of new symbols and concepts, and in many cases default interpretation of the tolerance indicators have changed, in addition two new versions of American standard ASME Y14.5 (2009 and 2018) have appeared. This book is an ideal introduction to geometrical dimensioning and tolerancing for students, and an essential reference for researchers and practitioners in the fields of design, manufacturing and inspection. - Reflects the latest ISO standards up to 2019 and ASME Y14.5 –2018 - Presents the rules and cases of geometric tolerances that are clearly explained with a wealth of examples and application cases presented with excellent technical drawings - Covers tolerancing methods for specific manufacturing processes - Includes a detailed chapter that covers everything a practitioner needs to know about the inspection of geometric tolerances

This book offers a genuinely practical introduction to the most commonly encountered optical and non-optical systems used for the metrology and characterization of surfaces, including guidance on best practice, calibration, advantages and disadvantages, and interpretation of results. It enables the user to select the best approach in a given context. Most methods in surface metrology are based upon the interaction of light or electromagnetic radiation (UV, NIR, IR), and different optical effects are utilized to get a certain optical response from the surface; some of them record only the intensity reflected or scattered by the surface, others use interference of EM waves to obtain a characteristic response from the surface. The book covers techniques ranging from microscopy (including confocal, SNOM and digital holographic microscopy) through interferometry (including white light, multi-wavelength, grazing incidence and shearing) to spectral reflectometry and ellipsometry. The non-optical methods comprise tactile methods (stylus tip, AFM) as well as capacitive and inductive methods (capacitive sensors, eddy current sensors). The book provides: Overview of the working principles Description of advantages and disadvantages Currently achievable numbers for resolutions, repeatability, and reproducibility Examples of real-world applications A final chapter discusses examples where the combination of different surface metrology techniques in a multi-sensor system can reasonably contribute to a better understanding of surface properties as well as a faster characterization of surfaces in industrial applications. The book is aimed at scientists and engineers who use such methods for the measurement and characterization of surfaces across a wide range of fields and industries, including electronics, energy, automotive and medical engineering.

This introduction to descriptive geometry and contemporary drafting guides the student through the essential principles to create engineering drawings that comply with international standards of technical product specification. This heavily updated new edition now applies to CAD as well as conventional drawing. Extensive new coverage is given of: • International drafting conventions • Methods of spatial visualisation such as multi-view projection • Types of views • Dimensioning • Dimensional and geometric tolerancing • Representation of workpiece and machine elements • Assembly drawings Comprehensible illustrations and clear explanations help the reader master drafting and layout concepts for creating professional engineering drawings. The book provides a large number of exercises for each main topic. This edition covers updated material and reflects the latest ISO standards. It is ideal for undergraduates in engineering or product design, students of vocational courses in engineering communication and technology students covering the transition of product specification from design to production.

Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. Richard Leach introduces these techniques to a broad audience of engineers and scientists involved in nanotechnology and manufacturing applications and research. He also provides a routemap and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale. Starting from the fundamentals of precision measurement, the author progresses into different measurement and characterization techniques. The focus on nanometrology in engineering contexts makes this book an essential guide for the emerging nanomanufacturing / nanofabrication sector, where measurement and standardization requirements are paramount both in product specification and quality assurance. This book provides engineers and scientists with the methods and understanding needed to design and produce high-performance, long-lived products while ensuring that compliance and public health requirements are met. Updated to cover new and emerging technologies, and recent developments in standards and regulatory frameworks, this second edition includes many new sections, e.g. new technologies in scanning probe and e-beam microscopy, recent developments in interferometry and advances in co-ordinate metrology. - Demystifies nanometrology for a wide audience of engineers, scientists, and students involved in nanotech and advanced manufacturing applications and research - Introduces metrologists to the specific techniques and equipment involved in measuring at the nano-scale or to nano-scale uncertainty - Fully updated to cover the latest technological developments, standards, and regulations