Optical imaging starts with geometrical optics, and ray tracing lies at its forefront. This book starts with Fermat’s principle and derives the three laws of geometrical optics from it. After discussing imaging by refracting and reflecting systems, paraxial ray tracing is used to determine the size of imaging elements and obscuration in mirror systems. Stops, pupils, radiometry, and optical instruments are also discussed. The chromatic and monochromatic aberrations are addressed in detail, followed by spot sizes and spot diagrams of aberrated images of point objects. Each chapter ends with a summary and a set of problems. The book ends with an epilogue that summarizes the imaging process and outlines the next steps within and beyond geometrical optics.

This book is the culmination of twenty-five years of teaching Geometrical Optics. The volume is organised such that the single spherical refracting surface is the basic optical element. Spherical mirrors are treated as special cases of refraction, with the same applicable equations. Thin lens equations follow as combinations of spherical refracting surfaces while the cardinal points of the thick lens make it equivalent to a thin lens. Ultimately, one set of vergence equations are applicable to all these elements.The chapters are devoted to in-depth treatments of stops, pupils and ports; magnifiers, microscopes, telescopes, and camera lenses; ophthalmic instruments; resolving power and MTF; trigonometric ray tracing; and chromatic and monochromatic aberrations. There are over 100 worked examples, 400 homework problems and 400 illustrations.First published in 1994 by Penumbra Publishing Co.

The three volumes in the PRINCIPLES OF ELECTRON OPTICS Series constitute the first comprehensive treatment of electron optics in over forty years. While Volumes 1 and 2 are devoted to geometrical optics, Volume 3 is concerned with wave optics and effects due to wave length. Subjects covered include:Derivation of the laws of electron propagation from SchrUdinger's equationImage formation and the notion of resolutionThe interaction between specimens and electronsImage processingElectron holography and interferenceCoherence, brightness, and the spectral functionTogether, these works comprise a unique and informative treatment of the subject. Volume 3, like its predecessors, will provide readers with both a textbook and an invaluable reference source.

An accessible, well presented introduction to the theory of optical aberrations, covering key topics that are often missing from comparable books.

This text is written for engineers and scientists who have some experience in the field of optics and want to know more about the details and derivations of equations used in optical design. Organized by topic, the book begins with the fundamental law of geometrical optics, Snell's law of refraction, and states the paraxial ray trace equations, then moves on to thin lenses and increasingly more sophisticated components and multi-element systems. Each topic is covered in depth and provides comprehensive information on performance and limitations. While the text is based on general optical laws, special emphasis has been placed on the two major infrared regions--the mid-wave (MWIR) and the long-wave (LWIR). This is particularly important with regard to diffractive hybrids, which have found their place in these long-wavelength areas for the correction of chromatic aberrations and athermalization. Comments relating to single-point diamond turning have also been included because this process is predominantly used to produce optical elements for the infrared regions.