This modern approach to the subject is clearly and logically structured, and gives readers an understanding of the essence of Fourier transforms and their applications. All important aspects are included with respect to their use with optical spectroscopic data. Based on popular lectures, the authors provide the mathematical fundamentals and numerical applications which are essential in practical use. The main part of the book is dedicated to applications of FT in signal processing and spectroscopy, with IR and NIR, NMR and mass spectrometry dealt with both from a theoretical and practical point of view. Some aspects, linear prediction for example, are explained here thoroughly for the first time.

Algorithms for line finding, fitting spectra to voigtian profiles, filtering, Fourier transforming, and spectrum synthesis are a basis for spectrum analysis tools from which complex signal-processing procedures can be constructed.".

A bestselling classic reference, now expanded and updated to cover the latest instrumentation, methods, and applications The Second Edition of Fourier Transform Infrared Spectrometry brings this core reference up to date on the uses of FT-IR spectrometers today. The book starts with an in-depth description of the theory and current instrumentation of FT-IR spectrometry, with full chapters devoted to signal-to-noise ratio and photometric accuracy. Many diverse types of sampling techniques and data processing routines, most of which can be performed on even the less expensive instruments, are then described. Extensively updated, the Second Edition: * Discusses improvements in optical components * Features a full chapter on FT Raman Spectrometry * Contains new chapters that focus on different ways of measuring spectra by FT-IR spectrometry, including fourteen chapters on such techniques as microspectroscopy, internal and external reflection, and emission and photoacoustic spectrometry * Includes a new chapter introducing the theory of vibrational spectrometry * Organizes material according to sampling techniques Designed to help practitioners using FT-IR capitalize on the plethora of techniques for modern FT-IR spectrometry and plan their experimental procedures correctly, this is a practical, hands-on reference for chemists and analysts. It's also a great resource for students who need to understand the theory, instrumentation, and applications of FT-IR.

Introductory Fourier Transform Spectroscopy discusses the subject of Fourier transform spectroscopy from a level that requires knowledge of only introductory optics and mathematics. The subject is approached through optical principles, not through abstract mathematics. The book approaches the subject matter in two ways. The first is through simple optics and physical intuition, and the second is through Fourier analysis and the concepts of convolution and autocorrelation. This dual treatment bridges the gap between the introductory material in the book and the advanced material in the journals. The book also discusses information theory, Fourier analysis, and mathematical theorems to complete derivations or to give alternate views of an individual subject. The text presents the development of optical theory and equations to the extent required by the advanced student or researcher. The book is intended as a guide for students taking advanced research programs in spectroscopy. Material is included for the physicists, chemists, astronomers, and others who are interested in spectroscopy.

Practical Fourier Transform Infrared Spectroscopy: Industrial and Laboratory Chemical Analysis presents the Fourier Transform Infrared Spectroscopy (FT-IR) as a valuable analytic tool in solving industrial and laboratory chemical problems. The text provides chapters that deal with the various applications of FT-IR such as the characterization of organic and inorganic superconductors; the study of forensic materials such as controlled drug particles, fragments of polymers, textile fibers, and explosives; identification and quantification of impurities and measurement of epitaxial thickness in silicon; bulk and surface studies and microanalyses of industrial materials; and the identification or determination of unknown compounds. Chemists, industrial researchers, and product engineers will find the book useful.

Many applications today require the Fourier-transform (FT) spectrometer to perform close to its limitations, such as taking many quantitative measurements in the visible and in the near infrared wavelength regions. In such cases, the instrument should not be considered as a perfect "black box." Knowing where the limitations of performance arise and which components must be improved are crucial to obtaining repeatable and accurate results. One of the objectives of this book is to help the user identify the instrument's bottleneck.

New analytical strategies and techniques are necessary to meet requirements of modern technologies and new materials. In this sense, this book provides a thorough review of current analytical approaches, industrial practices, and strategies in Fourier transform application.