Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays

Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays
Title Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays PDF eBook
Author
Publisher
Pages 206
Release 1998
Genre Flatness measurement
ISBN

Download Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays Book in PDF, Epub and Kindle

National Semiconductor Metrology Program

National Semiconductor Metrology Program
Title National Semiconductor Metrology Program PDF eBook
Author National Institute of Standards and Technology (U.S.)
Publisher
Pages 160
Release 2000
Genre Semiconductors
ISBN

Download National Semiconductor Metrology Program Book in PDF, Epub and Kindle

National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999

National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999
Title National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999 PDF eBook
Author
Publisher
Pages 148
Release 1999
Genre
ISBN

Download National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999 Book in PDF, Epub and Kindle

National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000

National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000
Title National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000 PDF eBook
Author
Publisher
Pages 160
Release 2000
Genre
ISBN

Download National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000 Book in PDF, Epub and Kindle

National Semiconductor Metrology Program

National Semiconductor Metrology Program
Title National Semiconductor Metrology Program PDF eBook
Author National Semiconductor Metrology Program (U.S.)
Publisher
Pages 160
Release 2000
Genre Semiconductors
ISBN

Download National Semiconductor Metrology Program Book in PDF, Epub and Kindle

Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays

Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays
Title Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays PDF eBook
Author John C. Stover
Publisher
Pages 152
Release 1999
Genre Science
ISBN

Download Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays Book in PDF, Epub and Kindle

Process Control and Diagnostics

Process Control and Diagnostics
Title Process Control and Diagnostics PDF eBook
Author Michael L. Miller
Publisher SPIE-International Society for Optical Engineering
Pages 392
Release 2000
Genre Computers
ISBN

Download Process Control and Diagnostics Book in PDF, Epub and Kindle

The FAO/WHO Consultation on Health Implications of Acrylamide in Food has undertaken a preliminary evaluation of new and existing data and research on acrylamide. The consultation provided a range of recommendations for further information and new studies to better understand the risk to human health posed by acrylamide in food. The consultation also provided some advice to minimize whatever risk exists, including avoiding excessive cooking of food, choosing healthy eating, investigating possibilities for reducing levels of acrylamide in food and establishing an international network on acrylamide in food.