Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays
| Title | Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays PDF eBook |
| Author | |
| Publisher | |
| Pages | 206 |
| Release | 1998 |
| Genre | Flatness measurement |
| ISBN |
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Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays
| Title | Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays PDF eBook |
| Author | John C. Stover |
| Publisher | SPIE-International Society for Optical Engineering |
| Pages | 188 |
| Release | 1996 |
| Genre | Computer storage devices |
| ISBN | 9780819422507 |
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Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays
| Title | Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays PDF eBook |
| Author | |
| Publisher | |
| Pages | 188 |
| Release | 1996 |
| Genre | Flatness measurement |
| ISBN |
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Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II
| Title | Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II PDF eBook |
| Author | John C. Stover |
| Publisher | SPIE-International Society for Optical Engineering |
| Pages | 0 |
| Release | 1998 |
| Genre | Computers |
| ISBN | 9780819427144 |
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Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays
| Title | Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays PDF eBook |
| Author | John C. Stover |
| Publisher | |
| Pages | 152 |
| Release | 1999 |
| Genre | Science |
| ISBN |
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National Semiconductor Metrology Program
| Title | National Semiconductor Metrology Program PDF eBook |
| Author | National Institute of Standards and Technology (U.S.) |
| Publisher | |
| Pages | 160 |
| Release | 2000 |
| Genre | Semiconductors |
| ISBN |
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National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999
| Title | National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999 PDF eBook |
| Author | |
| Publisher | |
| Pages | 148 |
| Release | 1999 |
| Genre | |
| ISBN |
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