"Field Guide to Infrared Systems, Detectors, and FPAs, Third Edition is devoted to fundamental background issues for optical detection processes. It compares the characteristics of cooled and uncooled detectors with an emphasis on spectral and blackbody responsivity, detectivity, as well as the noise mechanisms related to optical detection. It introduces the concepts of barrier infrared detector technologies, and encompasses the capabilities and challenges of third-generation infrared focal plane arrays as well as the advantages of using dual-band technology. The book combines numerous engineering disciplines necessary for the development of an infrared system. It considers the development of search infrared systems and specifies the main descriptors used to characterize thermal imaging systems. Furthermore, this guide clarifies, identifies, and evaluates the engineering tradeoffs in the design of an infrared system"--

"Field Guide to Infrared Optics, Materials, and Radiometry covers all aspects of IR optics, including monochromatic and chromatic optical aberrations as well as important concepts such as depth of focus, depth of field, hyperfocal distance, warm shields, aspheric surfaces, and kinoforms. It also provides a comprehensive introduction to the optical, mechanical, and thermal properties of infrared materials as well as the essentials of radiometry and sources necessary for the quantitative understanding of infrared signatures and flux transfer, spectral atmospheric transmittance, and path radiance"--

This comprehensive reference details the principles and components of the Linear Shift-Invariant (LSI) infrared and electro-optical systems and shows you how to combine this approach with calculus and domain transformations to achieve a successful imaging system analysis. Ultimately, the steps described in this book lead to results in quantitative characterizations of performance metrics such as modulation transfer functions, minimum resolvable temperature difference, minimum resolvable contrast, and probability of object discrimination. The book includes an introduction to two-dimensional functions and mathematics which can be used to describe image transfer characteristics and imaging system components. You also learn diffraction concepts of coherent and incoherent imaging systems which show you the fundamental limits of their performance. By using the evaluation procedures contained in this desktop reference, you become capable of predicting both sensor test and field performance and quantifying the effects of component variations.

This newly revised and updated edition offers a current and complete introduction to the analysis and design of Electro-Optical (EO) imaging systems. The Third Edition provides numerous updates and several new chapters including those covering Pilotage, Infrared Search and Track, and Simplified Target Acquisition Model. The principles and components of the Linear Shift-Invariant (LSI) infrared and electro-optical systems are detailed in full and help you to combine this approach with calculus and domain transformations to achieve a successful imaging system analysis. Ultimately, the steps described in this book lead to results in quantitative characterizations of performance metrics such as modulation transfer functions, minimum resolvable temperature difference, minimum resolvable contrast, and probability of object discrimination. The book includes an introduction to two-dimensional functions and mathematics which can be used to describe image transfer characteristics and imaging system components. You also learn diffraction concepts of coherent and incoherent imaging systems which show you the fundamental limits of their performance. By using the evaluation procedures contained in this desktop reference, you become capable of predicting both sensor test and field performance and quantifying the effects of component variations. The book contains over 800 time-saving equations and includes numerous analyses and designs throughout. It also includes a reference link to special website prepared by the authors that augments the book in the classroom and serves as an additional resource for practicing engineers. With its comprehensive coverage and practical approach, this is a strong resource for engineers needing a bench reference for sensor and basic scenario performance calculations. Numerous analyses and designs are given throughout the text. It is also an excellent text for upper-level students with an interest in electronic imaging systems.

"Among the many materials investigated in the infrared (IR) field, narrow-gap semiconductors are the most important in IR photon detector family. Although the first widely used narrow-gap materials were lead salts (during the 1950s, IR detectors were built using single-element-cooled PbS and PbSe photoconductive detectors, primary for anti-missile seekers), this semiconductor family was not well distinguished. This situation seems to have resulted from two reasons: the preparation process of lead salt photoconductive polycrystalline detectors was not well understood and could only be reproduced with well-tried recipes; and the theory of narrow-gap semiconductor bandgap structure was not well known for correct interpretation of the measured transport and photoelectrical properties of these materials"--

Examines both the current and future performance of infrared focal plane arrays that use the various device architectures associated with these two materials technologies. All spectral bands from long wavelength (LWIR) through mid-wavelength (MWIR) to short wavelength (SWIR) are considered, with a view to achieving background and diffraction-limited system performance at room temperature for all wavelengths.

An up-to-date view of the various detector/emitter materials systems currently in use or being actively researched. The book is aimed at newcomers and those already working in the IR industry. It provides both an introductory text and a valuable overview of the entire field.