The DATE conference is the main European event bringing together designers and design automation users, researchers and vendors as well as specialists in the hardware and software design, test and manufacturing of electronic circuits and systems DATE puts a strong emphasis on both technology and systems, covering ICs SoCs, reconfigurable hardware and embedded systems as well as embedded software

In 2007 The Design, Automation and Test in Europe (DATE) conference celebrated its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent historical overview of the evolution of a domain that contributed substantially to the growth and competitiveness of the circuit electronics and systems industry.

Proceedings of the conference jointly presented by EDAC, ETC, and EuroASIC--and therefore the premier European event in the field of CAD, design, and test of circuits and systems. The major emphasis of the CAD portion is on high level design and verification tools, but information on the latest developments in logic synthesis and layout automation is also supplied. The key area of focus in design is in digital design and design methodologies, but papers on mixed digital/analog and full system design are also presented. The emphasis in test is on design for testability and novel methods for fault simulation and test generation, with sessions on new test techniques such as inductive fault analysis and IDDQ testing. No index. Acidic paper. Annotation copyright by Book News, Inc., Portland, OR