Environmental stress screening (ESS) has become one of the primary approaches in the modern electronic industry to precipitate and eliminate latent or hidden defects in electronic products which are introduced mainly during the manufacturing, assembling and packaging processes. Temperature cycling, plus random vibration (shaking and baking) are the primary processes of ESS. This text presents coverage of the subject, from basic concepts and the historical evolution of ESS, to the statistical and physical quantification of ESS.

Practical Reliability of Electronic Equipment and Products will help electrical, electronics, manufacturing, mechanical, systems design, and reliability engineers; electronics production managers; electronic circuit designers; and upper-level undergraduate and graduate students in these disciplines.

The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. ". . . a goldmine of knowledge on accelerated life testing principles and practices . . . one of the very few capable of advancing the science of reliability. It definitely belongs in every bookshelf on engineering." –Dev G. Raheja, Quality and Reliability Engineering International ". . . an impressive book. The width and number of topics covered, the practical data sets included, the obvious knowledge and understanding of the author and the extent of published materials reviewed combine to ensure that this will be a book used frequently." –Journal of the Royal Statistical Society A benchmark text in the field, Accelerated Testing: Statistical Models, Test Plans, and Data Analysis offers engineers, scientists, and statisticians a reliable resource on the effective use of accelerated life testing to measure and improve product reliability. From simple data plots to advanced computer programs, the text features a wealth of practical applications and a clear, readable style that makes even complicated physical and statistical concepts uniquely accessible. A detailed index adds to its value as a reference source.

A unique book that describes the practical processes necessary to achieve failure free equipment performance, for quality and reliability engineers, design, manufacturing process and environmental test engineers. This book studies the essential requirements for successful product life cycle management. It identifies key contributors to failure in product life cycle management and particular emphasis is placed upon the importance of thorough Manufacturing Process Capability reviews for both in-house and outsourced manufacturing strategies. The readers? attention is also drawn to the many hazards to which a new product is exposed from the commencement of manufacture through to end of life disposal. Revolutionary in focus, as it describes how to achieve failure free performance rather than how to predict an acceptable performance failure rate (reliability technology rather than reliability engineering) Author has over 40 years experience in the field, and the text is based on classroom tested notes from the reliability technology course he taught at Massachusetts Institute of Technology (MIT), USA Contains graphical interpretations of mathematical models together with diagrams, tables of physical constants, case studies and unique worked examples

The potential threat posed by Leonid meteroids to orbiting spacecraft over the next several years calls for new dynamic mitigation strategies to assist the satellite community in reducing the danger to its vehicles. This book offers deliberate dynamic mitigation strategies to complement the traditional shielding strategies, providing mission operators additional ways to decrease the danger. Five different attitude control and orbit maneuvering options are examined in detail. The information is presented in algorithmic form to allow technically competent, but meteoroid inexperienced, operators to easily understand the phenomena, assess the danger, and implement procedures. Although general in scope, the book emphasizes the Leonid meteor events of the 1998-2002 timeframe.