During the last five years transmission electron microscopy (TEM) has added numerous important new data to mineralogy and has considerably changed its outlook. This is partly due to the fact that metallurgists and crystal physicists having solved most of the structural and crystallographic problems in metals have begun to show a widening interest in the much more complicated structures of minerals, and partly to recent progress in experimental techniques, mainly the availability of ion-thinning devices. While electron microscopists have become increasingly interested in minerals (judging from special symposia at recent meetings such as Fifth European Congress on Electron microscopy, Man chester 1972; Eight International Congress on Electron Microscopy, Canberra 1974) mineralogists have realized advantages of the new technique and applied it with increasing frequency. In an effort to coordinate the growing quantity of research, electron microscopy sessions have been included in meetings of mineralogists (e. g. Geological Society of America, Minneapolis, 1972, American Crystallographic Association, Berkeley, 1974). The tremendous response for the TEM symposium which H. -R. Wenk and G. Thomas organized at the Berkeley Conference of the American Crystallographic Association formed the basis for this book. It appeared useful at this stage to summarize the achievements of electron microscopy, scattered in many different journals in several different fields and present them to mineralogists. A group of participants as the Berkeley symposium formed an Editorial Committee and outlined the content of this book.

Of the many techniques that have been applied to the study of crystal defects, none has contributed more to our understanding of their nature and influence on the physical and chemical properties of crystalline materials than transmission electron microscopy (TEM). TEM is now used extensively by an increasing number of earth scientists for direct observation of defect microstructures in minerals and rocks. Transmission Electron Microscopy of Rocks and Minerals is an introduction to the principles of the technique and is the only book to date on the subject written specifically for geologists and mineralogists. The first part of the book deals with the essential physics of the transmission electron microscope and presents the basic theoretical background required for the interpretation of images and electron diffraction patterns. The final chapters are concerned with specific applications of TEM in mineralogy and deal with such topics as planar defects, intergrowths, radiation-induced defects, dislocations and deformation-induced microstructures. The examples cover a wide range of rock-forming minerals from crustal rocks to those in the lower mantle, and also take into account the role of defects in important mineralogical and geological processes.

Of the many techniques that have been applied to the study of crystal defects, none has contributed more to our understanding of their nature and influence on the physical and chemical properties of crystalline materials than transmission electron microscopy (TEM). TEM is now used extensively by an increasing number of earth scientists for direct observation of defect microstructures in minerals and rocks. Transmission Electron Microscopy of Rocks and Minerals is an introduction to the principles of the technique and is the only book to date on the subject written specifically for geologists and mineralogists. The first part of the book deals with the essential physics of the transmission electron microscope and presents the basic theoretical background required for the interpretation of images and electron diffraction patterns. The final chapters are concerned with specific applications of TEM in mineralogy and deal with such topics as planar defects, intergrowths, radiation-induced defects, dislocations and deformation-induced microstructures. The examples cover a wide range of rock-forming minerals from crustal rocks to those in the lower mantle, and also take into account the role of defects in important mineralogical and geological processes.

Volume 27 of Reviews in Mineralogy provides a background to the TEM as a mineralogical tool, to give an introduction to the principles underlying its operation, and to explore mineralogical applications and ways in which electron microscopy can augment our knowledge of mineral structures, chemistry, and origin. Much time will be devoted to mineralogical applications. It provides sufficient information to allow mineralogists and petrologists to have an informed understanding of the data produced by transmission electron microscopy and to have enough knowledge and experience to undertake initial studies on their own. The opening chapters cover the principles of electron microscopy and chemical analysis using the TEM; while the following chapters consider mineralogical, petrological, and geochemical applications and their implications, for both low- and high-temperature geological environments. The Mineralogical Society of America sponsored a short courses in conjunction with their annual meetings with the Geological Society of America, and this volume represents the proceedings of the eighteenth in the sequence. This TEM course was convened October 23-25, 1992, at Hueston Woods State Park, College Comer, Ohio.

The decision of Springer-Verlag to publish this book in English came as a pleasant surprise. The fact is that I started writing the first version of the book back in 1978. I wished to attract attention to potentialities inherent in selected-area electron diffraction (SAED) which, for various reasons, were not being put to use. By that time, I had at my disposal certain structural data on natural and synthetic minerals obtained using SAED and high-resolution electron microscopy (HREM), and this stimulated my writing this book. There were several aspects concerning these data that I wished to emphasize. First, it was mostly new and understudied minerals that possess the peculiar structural features studied by SAED and HREM. This could interest mineralogists, crystallo chemists, and crystallographers. Second, the results obtained indi cated that, under certain conditions, SAED could be an effective, and sometimes the only possible, method for structure analysis of minerals. This inference was of primary importance, since fine dispersion and poor crystallinity of numerous natural and synthe tic minerals makes their structure study by conventional diffrac tion methods hardly possible. Third, it was demonstrated that in many cases X-ray powder diffraction analysis of dispersed miner als ought to be combined with SAED and local energy dispersion analysis. This was important, since researchers in structural min eralogy quite often ignored, and still ignore even the simplest in formation which is readily available from geometrical analysis of SAED patterns obtained from microcrystals.

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

The decision of Springer-Verlag to publish this book in English came as a pleasant surprise. The fact is that I started writing the first version of the book back in 1978. I wished to attract attention to potentialities inherent in selected-area electron diffraction (SAED) which, for various reasons, were not being put to use. By that time, I had at my disposal certain structural data on natural and synthetic minerals obtained using SAED and high-resolution electron microscopy (HREM), and this stimulated my writing this book. There were several aspects concerning these data that I wished to emphasize. First, it was mostly new and understudied minerals that possess the peculiar structural features studied by SAED and HREM. This could interest mineralogists, crystallo chemists, and crystallographers. Second, the results obtained indi cated that, under certain conditions, SAED could be an effective, and sometimes the only possible, method for structure analysis of minerals. This inference was of primary importance, since fine dispersion and poor crystallinity of numerous natural and synthe tic minerals makes their structure study by conventional diffrac tion methods hardly possible. Third, it was demonstrated that in many cases X-ray powder diffraction analysis of dispersed miner als ought to be combined with SAED and local energy dispersion analysis. This was important, since researchers in structural min eralogy quite often ignored, and still ignore even the simplest in formation which is readily available from geometrical analysis of SAED patterns obtained from microcrystals.