The International Workshop EMC Compo 2013 is focused on emission and susceptibility as well as power and signal integrity issues of digital, analogue and mixed signal integrated circuits, simulation, measurement, and modeling techniques

The achievements in terms of operating frequency and integration of semiconductor technology are constantly creating new challenges in EMC, which must necessarily be addressed at both the integrated circuit and system level Keeping up to date is of paramount importance to be successful in this field The 10th International Workshop EMC Compo 2015 is intended to be a place for exchange of the latest research achievements and experience in IC level EMC and it is addressed to researchers and Engineers from industry and from academia The workshop is focused on emission and susceptibility issues in digital, analogue and mixed signal integrated circuits The most recent advances in simulation and measurement techniques, models, standards, tools and design methodologies will be discussed A Technical Exhibition will also be held James Clerk Maxwell was born in Edinburgh and there will be an opportunity for delegates to visit his birthplace, in recognition of 150 years of his equations