Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented.

Environmental electromagnetic pollution has drastically increased over the last decades. The omnipresence of communication systems, various electronic appliances and the use of ever increasing frequencies, all contribute to a noisy electromagnetic environment which acts detrimentally on sensitive electronic equipment. Integrated circuits must be able to operate satisfactorily while cohabiting harmoniously in the same appliance, and not generate intolerable levels of electromagnetic emission, while maintaining a sound immunity to potential electromagnetic disturbances: analog integrated circuits are in particular more easily disturbed than their digital counterparts, since they don't have the benefit of dealing with predefined levels ensuring an innate immunity to disturbances. The objective of the research domain presented in EMC of Analog Integrated Circuits is to improve the electromagnetic immunity of considered analog integrated circuits, so that they start to fail at relevantly higher conduction levels than before.

The achievements in terms of operating frequency and integration of semiconductor technology are constantly creating new challenges in EMC, which must necessarily be addressed at both the integrated circuit and system level Keeping up to date is of paramount importance to be successful in this field The 10th International Workshop EMC Compo 2015 is intended to be a place for exchange of the latest research achievements and experience in IC level EMC and it is addressed to researchers and Engineers from industry and from academia The workshop is focused on emission and susceptibility issues in digital, analogue and mixed signal integrated circuits The most recent advances in simulation and measurement techniques, models, standards, tools and design methodologies will be discussed A Technical Exhibition will also be held James Clerk Maxwell was born in Edinburgh and there will be an opportunity for delegates to visit his birthplace, in recognition of 150 years of his equations

Offers a text useful for practicing nonspecialist engineers and those new to EMC Contains worked examples and applications of all equations Provides computer code and contains programs available for readers Covers certification EMC measurement techniques Includes a full chapter on system level EMC/EMI

This book shows how the analytic tools of circuit theory can be used to simulate the coupling of interference into, and out of, any signal link in the system being reviewed.