In statistical process control, control charts are one tool for monitoring the control status of a process. One such type of chart is the cumulative sum (CUSUM) chart which has advantages over other styles of control chart. A study of the economic design of CUSUM control charts is undertaken via a comparative study of long-run hourly cost (LRHC) and a computational search algorithm is used to minimize LRHC for a CUSUM chart using nine parameters confined to their respective feasible parameter spaces as defined by the chart designer. Savings over similarly designed two stage Xbar charts are discovered and presented.

Control charts are widely used in industry to monitor processes that are far from Zero-Defect (ZD), and their use in a near Zero-Defect manufacturing environment poses many problems. This book presents techniques of using control charts for high-quality processes, and some recent findings and applications of statistical control chart techniques for ZD processes are presented. A powerful technique based on counting of the cumulative conforming (CCC) items between two nonconforming ones is discussed in detail. Extensions of the CCC chart are described, as well as applications of cumulative sum and exponentially weighted moving average techniques to CCC-related data, multivariate methods, economic design of control chart procedures, and modeling and analysis of trended but regularly adjusted processes. Many examples, charts, and procedures, are presented throughout the book, and references are provided for those interested in exploring the details. A number of questions and issues are posed for further investigations. Researchers and students may find many ideas in this book useful in their academic work, as a foundation is laid for the exploration of many further theoretical and practical issues.

This volume treats the three main categories of Statistical Quality Control: General Aspects of SQC Methodology, On-line Control including Sampling Plans, Control Charts and Monitoring, and Off-line Control including Data Analysis, Calibration and Experimental Design. Experts with international reputation present their newest contributions.