Draft Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
Title | Draft Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators PDF eBook |
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Pages | |
Release | 2005 |
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Unapproved IEEE Draft Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators (Superseded by Approved Draft).
Title | Unapproved IEEE Draft Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators (Superseded by Approved Draft). PDF eBook |
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Release | 2005 |
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Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
Title | Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators PDF eBook |
Author | British Standards Institute Staff |
Publisher | |
Pages | 26 |
Release | 1914-08-31 |
Genre | |
ISBN | 9780580856464 |
Organic chemistry, Optoelectronic devices, Electronic equipment and components, Semiconductor devices
IEEE Std P1620.1/D8, Jul 2005
Title | IEEE Std P1620.1/D8, Jul 2005 PDF eBook |
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Release | 2005 |
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ISBN | 9781504430494 |
IEEE Std P1620.1/D8
Title | IEEE Std P1620.1/D8 PDF eBook |
Author | |
Publisher | |
Pages | |
Release | 2005 |
Genre | |
ISBN | 9781504430487 |
Test Methods for the Characterization of Organic Transistor-based Ring Oscillators
Title | Test Methods for the Characterization of Organic Transistor-based Ring Oscillators PDF eBook |
Author | British Standards Institution |
Publisher | |
Pages | 0 |
Release | 2014 |
Genre | |
ISBN |
Test Methods for the Characterization of Organic Transistor-based Ring Oscillators
Title | Test Methods for the Characterization of Organic Transistor-based Ring Oscillators PDF eBook |
Author | |
Publisher | |
Pages | 0 |
Release | 2013 |
Genre | Oscillators, Electric |
ISBN | 9780738186870 |
Abstract: Recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators are covered. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators. Keywords: electrical characterization, high-impedance printing, organic transistor, printed electronics, ring oscillator.